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JP2000260910A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device and method of manufacturing semiconductor device

Assignee: Oki Electric Industry Co Ltd
•
Filing: 1999-03-11
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Granted: —
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Expires: 2019-03-11
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Abstract

Abstract PROBLEM TO BE SOLVED: To prevent peeling of resin and semiconductor by forming electrode pads on a semiconductor substrate, forming protruding electrodes on sealing resin sealing the semiconductor substrate, and connecting electrically the electrode pads with the protruding electrodes. SOLUTION: The thickness of a semiconductor substrate 1 is made a specified value in the central part 11, and the thickness of the semiconductor substrate 1 in the peripheral part 12 of a semiconductor element is made thinner than that in the central part 11 to form the peripheral part 6. A wiring 3 of Cu is formed on the semiconductor substrate 1 and electrically connected with aluminum electrode pads 2. The surface of the semiconductor substrate 1 and the wiring 3 are sealed with resin 4. Protruding electrodes 5 as bumps formed of solder or the like are formed on the sealed resin 4 and electrically connected with the aluminum electrode pads 2. Thereby trouble of peeling of the resin 4 and the semiconductor substrate 1 is excluded, and cracks of the surface of the semiconductor element are reduced.

Inventors

  • 👤 Akio Nakamura
  • 👤 彰男 中村

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-02 15:02
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/10; H10W74/131; H10W74/141; H10D; H10D62/00; H10D62/10; H10D62/117; H10P; H10P54/00; H10W74/01; H10W74/134; H10W70/00; H10W70/60; H10W72/00; H10W72/01; H10W72/013; H10W72/01331; H10W72/019; H10W72/071; H10W72/072; H10W72/07251; H10W72/20; H10W72/241; H10W72/242; H10W72/251; H10W72/252; H10W72/90; H10W72/921; H10W72/922; H10W72/941; H10W72/9415; H10W72/942; H10W72/944; H10W72/9445

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