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JP2000223697A Expired / Lapsed JP ⏱️ 0.0 years remaining

Heterojunction field effect transistor

Assignee: NEC Corp
•
Filing: 1999-01-29
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Granted: —
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Expires: 2019-01-29
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Abstract

Abstract Translated from Japanese (57)【要約】 【課題】 本発明の目的は、しきい値電圧の制御性を改 善し、ディプレッション型、エンハンスメント型FET の作り分けを可能にするHJFET構造を提供すること にある。 【解決手段】 基板10に接して、少なくとも1層のGa Nを含むバッファ層11、チャネル層12、ゲート絶縁層1 3、ソース電極17S、ドレイン電極17D、ゲート電極19を 有するヘテロ接合電界効果トランジスタにおいて、前記 チャネル層12の組成がInZGa1-ZN(0≦z<1)で あり、前記ゲート絶縁層13がInAlGaN層であり、 前記ソース17Sおよびドレイン電極17Dが前記のチャネル 層12とオーム性接触しており、前記ゲート電極19と前記 ゲート絶縁層13の間にショトキー性接触が取られている ことを特徴とするヘテロ接合電界効果トランジスタを提 供する。 (57) An object of the present invention is to improve the controllability of a threshold voltage, and to realize a depletion type and enhancement type FET. It is an object of the present invention to provide an HJFET structure that enables the fabrication of different types. SOLUTION: At least one layer of Ga is in contact with a substrate 10. N-containing buffer layer 11, channel layer 12, gate insulating layer 1 3. In a heterojunction field effect transistor having a source electrode 17S, a drain electrode 17D, and a gate electrode 19, the composition of the channel layer 12 is InZGa1-ZN (0 ≦ z <1), and the gate insulating layer 13 is an InAlGaN layer. And A heterojunction electric field, wherein the source 17S and the drain electrode 17D are in ohmic contact with the channel layer 12, and a Schottky contact is established between the gate electrode 19 and the gate insulating layer 13. An effect transistor is provided.

Inventors

  • 👤 Yuji Ando
  • 👤 裕二 安藤

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-08 14:11
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/80; H10D30/801; H10D30/40; H10D30/47; H10D30/471; H10D30/475; H10D30/4755; H10D62/00; H10D62/80; H10D62/85; H10D62/8503

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