GB1574423A
Expired / Lapsed
GB
⏱️ 0.0 years remaining
Optical test apparatus and method for examining an object
Assignee: SIRA INSTITUTE
•
Filing: 1977-03-16
•
Granted: —
•
Expires: 1997-03-16
Abstract
No abstract record available.
Inventors
No inventors recorded.
Bibliographic Details
Application Number
—
Jurisdiction
GB
Data Source
google_patents
Last Synchronized
2026-11-06 02:13
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88; G01N21/89; G01N21/8901
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
103 words
Optical test apparatus for examining an object the apparatus comprising a source of radiation; a pattern comprising a regular array of two different types of area which influence the radiation differently; means for passing the radiation from the radiation source to the object and then to the pattern including a focusing device for providing a beam of the radiation at the pattern and the object; scanner means for causing relative movement of the beam of radiation across both the object and the different types of area of the pattern; and collector means for collecting radiation influenced by both the pattern and the object.
Claim 2
Dependent Claim
103 words
Optical test apparatus for examining an object the apparatus comprising a source of radiation; a pattern comprising a regular array of two different types of area which influence the radiation differently; means for passing the radiation from the radiation source to the object and then to the pattern including a focusing device for providing a beam of the radiation at the pattern and the object; scanner means for causing relative movement of the beam of radiation across both the object and the different types of area of the pattern; and collector means for collecting radiation influenced by both the pattern and the object.
Claim 3
Dependent Claim
45 words
Apparatus as claimed in claim 1 in which the scanning means is arranged to scan the beam in a linear manner and the pattern is in a linear form so that, in use, the beam traverses the pattern from one type of area to another.
Claim 4
Dependent Claim
43 words
Apparatus as claimed in claim 1 in which the scanning means is arranged to scan the beam in a generally circular manner and the pattern is a radial pattern so that the beam traverses the pattern from one type of area to another.
Claim 5
Dependent Claim
22 words
Apparatus as claimed in any of claim 1 to 3 in which, in use, the beam is influenced once by the pattern.
Claim 6
Dependent Claim
45 words
Apparatus as claimed in any of claims 1 to 3 in which a retroreflective or reflective means is provided to reflect the beam received from the pattern back through the pattern, a beam splitter being provided to separate the reflected beam from the incident beam.
Claim 7
Dependent Claim
25 words
Apparatus as claimed in any of claims 1 to 5 in which the pattern is a regular grating of radiation absorbing and radiation transmitting areas.
Claim 8
Dependent Claim
25 words
Apparatus as claimed in any of claims 1 to 5 in which the pattern is a regular grating of radiation absorbing and radiation reflecting areas.
Claim 9
Dependent Claim
35 words
Apparatus as claimed in claim 6 or 7 in which the focusing means is arranged so that the beam width at the object is substantially twice the width of the radiation transmitting or reflecting areas.
Claim 10
Dependent Claim
19 words
Apparatus as claimed in any of claims 1 to 8 in which the source of radiation comprises a laser.
Claim 11
Dependent Claim
28 words
Optical test apparatus as claimed in claim 1 substantially as hereinbefore described with reference to Figures 1 to 8 or Figures 9 and 10 of the accompanying drawings.
Claim 12
Independent Claim
77 words
A method of examining an object comprising focussing a beam of radiation, passing the beam of radiation to the object so as to be influenced by the object and from the object to a pattern comprising a regular array of two different types of area which influence the radiation differently, the beam of radiation being scanned across both the object and the pattern, and collecting and analysing the radiation influenced by both the pattern and the object.
Claim 13
Independent Claim
77 words
A method of examining an object comprising focussing a beam of radiation, passing the beam of radiation to the object so as to be influenced by the object and from the object to a pattern comprising a regular array of two different types of area which influence the radiation differently, the beam of radiation being scanned across both the object and the pattern, and collecting and analysing the radiation influenced by both the pattern and the object.
Claim 14
Dependent Claim
11 words
A method as claimed in claim 11 substantially as hereinbefore described.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
Maintenance schedule is calculated for granted US utility patents.