FR1374702A
Expired / Lapsed
FR
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Automatic electron beam alignment device for electronic microscopes and similar instruments
Assignee: Hitachi Ltd
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Filing: 1963-11-08
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Granted: 1964-10-09
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Expires: 1983-11-08
Abstract
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Inventors
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Bibliographic Details
Application Number
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Jurisdiction
FR
Data Source
google_patents
Last Synchronized
2026-10-30 11:35
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04; H01J37/147; H01J37/1471; H01J37/244; H01J2237/00; H01J2237/244; H01J2237/2446; H01J2237/24465; H01J2237/245; H01J2237/24507; H01J2237/24571; H01J2237/24578
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