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EP1643561A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

GaN-based semiconductor integrated circuit

Assignee: Furukawa Electric Co Ltd
•
Filing: 2005-09-23
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Granted: —
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Expires: 2025-09-23
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Abstract

Abstract A GaN-based semiconductor integrated circuit comprising a plurality of types of GaN-based semiconductor devices integrated on a single substrate, and one of the plurality of types of GaN-based semiconductor devices includes a Schottky diode. The Schottky diode includes a GaN-based semiconductor layer, a first anode and a second anode, wherein the first anode is joined to the GaN-based semiconductor layer to form a Schottky junction with a width smaller than the width of the GaN-based semiconductor layer, the second anode is joined to the GaN-based semiconductor layer to form a Schottky junction in a region other than the region in which the first anode is in contact with the GaN-based semiconductor layer, and electrically connected with the first anode, and the Schottky barrier formed between the second anode and the GaN-based semiconductor layer is higher than the Schottky barrier formed between the second anode and the GaN-based semiconductor layer.

Inventors

  • 👤 Seikoh The Furukawa Electric Co. Ltd. Yoshida

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-02 09:56
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/80; H10D84/811; H10D12/00; H10D12/411; H10D12/441; H10D30/00; H10D30/60; H10D30/67; H10D30/6729; H10D30/6737; H10D30/6738; H10D30/674; H10D30/675; H10D62/00; H10D62/80; H10D62/85; H10D64/00; H10D64/20; H10D64/23; H10D64/60; H10D64/64; H10D8/00; H10D8/60; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0158; H10D84/02; H10D84/05; H10D62/8503

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 148 words
A GaN-based semiconductor integrated circuit comprising a plurality of types of GaN-based semiconductor devices integrated on a substrate, wherein one of the plurality of types of GaN-based semiconductor devices includes a Schottky diode, the Schottky diode includes a GaN-based semiconductor layer, a first anode and a second anode, wherein the first anode is joined to the GaN-based semiconductor layer to form a Schottky junction with a width smaller than the width of the GaN-based semiconductor layer, the second anode is joined to the GaN-based semiconductor layer to form a Schottky junction in a region other than the region in which the first anode is in contact with the GaN-based semiconductor layer, and electrically connected with the first anode, and the Schottky barrier formed between the second anode and the GaN-based semiconductor layer is higher than the Schottky barrier formed between the first anode and the GaN-based semiconductor layer.
Claim 2
Dependent Claim 42 words
The GaN-based semiconductor integrated circuit according to claim 1, wherein the plurality of types of GaN-based semiconductor devices include at least one of an FET, an IGBT, a GTO and a thyristor, as a GaN-based semiconductor device other than the Schottky diode.
Claim 3
Dependent Claim 60 words
The GaN-based semiconductor integrated circuit according to claim 1, wherein the plurality of types of GaN-based semiconductor devices include the Schottky diode and an FET, wherein the FET has a device structure including a layer structure formed of almost the same semiconductor materials as the semiconductor materials forming the layer structure included in the device structure of the Schottky diode.
Claim 4
Dependent Claim 35 words
The GaN-based semiconductor integrated circuit according to claim 1 or 2, wherein a semiconductor device other than a GaN-based semiconductor device is integrated with the plurality of types of GaN-based semiconductor devices, on the substrate.
Claim 5
Dependent Claim 18 words
A power conversion device incorporating a GaN-based semiconductor integrated circuit according to any of claims 1 to 3.
Claim 6
Dependent Claim 14 words
A power conversion device incorporating a GaN-based semiconductor integrated circuit according to claim 4.
Claim 7
Dependent Claim 34 words
The GaN-based semiconductor integrated circuit according to claim 1, wherein the materials forming the first anode include any of metals Ti, Al, Ta, W and Ag or a silicide of any of these metals.
Claim 8
Dependent Claim 25 words
The GaN-based semiconductor integrated circuit according to claim 1, wherein the materials forming the second anode includes any of metals Pt, Ni, Pd and Au.

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