← Back to Patent Explorer
EP0911697A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

A fluorinated hard mask for micropatterning of polymers

Assignee: Imec
•
Filing: 1998-05-18
•
Granted: —
•
Expires: 2018-05-18
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract The present invention discloses the formation of a hard mask layer in an organic polymer layer by modifying at least locally the chemical composition of a part of said exposed organic low-k polymer. This modification starts from an exposed surface of the polymer and extends into the polymer thereby increasing the chemical resistance of the modified part of the polymer. As a result, this modified part can be used as a hard mask or an etch stop layer for plasma etching.

Inventors

  • 👤 Mikhail Rodionovich Baklanov
  • 👤 Serge Vanhaelemeersch
  • 👤 Karen Maex
  • 👤 Joost Waeterloos
  • 👤 Gilbert Declerck

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-30 14:13
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/074; G; G03; G03F; G03F7/00; G03F7/004; G03F7/09; G03F7/094; G03F7/26; G03F7/36; G03F7/38; G03F7/40; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/286; H10P50/287; H10P50/73; H10W20/081; H10W20/084; H10W20/086; H10W20/093; H10W20/096

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 83 words
A method for forming a patterned hard mask layer in an organic polymer film comprising the steps of: fluorinating a part of an organic polymer film, said fluorinated part forming a first hard mask layer; forming a patterned second hard mask layer on said film; patterning said first hard mask layer using said patterned second hard mask layer as a mask; removing said second hard mask layer; and etching said organic polymer film using said patterned first hard mask layer as a mask.
Claim 2
Dependent Claim 22 words
A method as recited in claim 1, wherein said organic polymer film is an organic polymer comprising at least one phenyl group.
Claim 3
Dependent Claim 33 words
A method as recited in claim 2, wherein said organic polymer film comprising at least one phenyl group is selected from a group comprising the benzocyclobutarenes, poly arylene ether, aromatic hydrocarbon, and polyimides.
Claim 4
Dependent Claim 32 words
A method as recited in claim 1, wherein said fluorination of said organic polymer layer is performed in an ambient comprising fluorine substantially without changing the thickness of said organic polymer layer.
Claim 5
Dependent Claim 51 words
A method as recited in claim 4, wherein said fluorine is generated from a source selected from the group comprising NF 3 , SF 6 , ClF 3 , F 2 , XeF 2 , and C x F y , x and y being positive whole numbers greater than zero.
Claim 6
Dependent Claim 23 words
A method as recited in claim 1, wherein said second hard mask layer is selected from the group comprising oxides, nitrides and oxynitrides.
Claim 7
Independent Claim 101 words
A method for patterning an organic polymer film comprising the steps of : defining at least one first region and at least one second region in an organic polymer film formed on a substrate, said first region being uncovered and said second region being covered with a layer forming a diffusion barrier for fluorine; exposing said first and said second region to an ambient comprising fluorine resulting in the fluorination of at least a part of said first region; removing said layer; selectively removing at least a part of said second region by etching, using said first region as a mask.
Claim 8
Dependent Claim 22 words
A method as recited in claim 7, wherein said organic polymer film is an organic polymer comprising at least one phenyl group.
Claim 9
Dependent Claim 33 words
A method as recited in claim 8, wherein said organic polymer film comprising at least one phenyl group is selected from a group comprising the benzocyclobutarenes, poly arylene ether, aromatic hydrocarbon, and polyimides.
Claim 10
Dependent Claim 27 words
A method as recited in claim 6, wherein said layer forming a diffusion barrier for fluorine is selected from the group comprising resists, oxides, nitrides and oxynitrides.
Claim 11
Dependent Claim 20 words
Use of the method as recited in claim 1 and claim 7 for the fabrication of devices comprising interconnect structures.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Maintenance schedule is calculated for granted US utility patents.

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag