EP0803892A2
Expired / Lapsed
EP
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Electron generating apparatus, image forming apparatus, method of manufacturing the same and method of adjusting characteristics thereof
Assignee: Canon Inc
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Filing: 1997-01-29
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Granted: —
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Expires: 2017-01-29
Abstract
Abstract It is an object of this invention to provide an electron generating apparatus which eliminates, with a simple process, variations in electron-emitting characteristics of electron sources caused by various factors, a method of adjusting the characteristics of the electron generating apparatus, a method of manufacturing the electron generating apparatus, and an image forming apparatus using the electron generating apparatus. Characteristic measuring voltages are applied from pulse generators (6, 7) to each surface-conduction emission device of a display panel (1), so that the electron-emitting characteristics are measured by a current detector (12). A pulse peak value setting circuit (8) is controlled to output a voltage signal having a peak value determined in the above manner, and characteristic shift voltages are applied from the pulse generators (6, 7) to the surface-conduction emission device. With this process, the electron-emitting characteristics of the surface-conduction emission devices are equalized. The characteristic shift voltage is higher than the characteristic measuring voltage, and the characteristic measuring voltage is higher than a driving voltage.
Inventors
- 👤 Eiji Yamaguchi
- 👤 Hidetoshi Suzuki
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-10-30 06:17
CPC Classifications
G; G09; G09G; G09G3/00; G09G3/20; G09G3/22; H; H01; H01J; H01J9/00; H01J9/02; H01J9/022; H01J9/027; G09G2320/00; G09G2320/02; G09G2320/0233; G09G2320/0285; G09G2320/029
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
139 words
A method of adjusting characteristics of an electron generating apparatus having a multi-electron-beam source in which a plurality of surface-conduction emission devices are arranged on a substrate, and driving means for outputting a driving voltage to said multi-electron-beam source, comprising the steps of: applying a characteristic measuring voltage to measure the characteristics of said plurality of surface-conduction emission devices; obtaining a reference value of the characteristics of said plurality of surface-conduction emission devices on the basis of the measured electron-emitting characteristics; and applying a characteristic shift voltage to a corresponding one of said plurality of surface-conduction emission devices such that the electron-emitting characteristics of said plurality of surface-conduction emission devices become values according to the reference value, wherein the characteristic shift voltage is higher than characteristic measuring voltage, and the characteristic measuring voltage is higher than the driving voltage.
Claim 2
Dependent Claim
32 words
The method according to claim 1, wherein the characteristic shift voltage is applied in an atmosphere in which a partial pressure of an organic gas is not more than 10 -8 Torr.
Claim 3
Dependent Claim
49 words
The method according to claim 1, further comprising the steps of measuring the characteristics of said plurality of surface-conduction emission devices again after application of the characteristic shift voltage, and applying the characteristic shift voltage to said corresponding surface-conduction emission device again on the basis of a remeasurement result.
Claim 4
Dependent Claim
29 words
The method according to claim 1, wherein the measuring step comprises measuring an emission current emitted from said surface-conduction emission device every time said surface-conduction emission device is driven.
Claim 5
Dependent Claim
29 words
The method according to claim 1, wherein the measuring step comprises measuring a device current flowing in said surface-conduction emission device every time said surface-conduction emission device is driven.
Claim 6
Dependent Claim
55 words
The method according to claim 1, wherein the measuring step comprises measuring a light emission luminance of the phosphor irradiated by the electron from said surface-conduction emission device every time said surface-conduction emission device is driven, and converting the measured luminance into a value corresponding to one of the emission current and the device current.
Claim 7
Independent Claim
178 words
A method of manufacturing an electron generating apparatus having a multi-electron-beam source in which a plurality of surface-conduction emission devices are arranged in a matrix on a substrate, and driving means for outputting a driving voltage to said multi-electron-beam source, comprising the steps of: forming electrodes and conductive films for said plurality of surface-conduction emission devices on said substrate; forming electron-emitting portions for said plurality of surface-conduction emission devices by performing electrification to said conductive films through said electrodes; activating said electron-emitting portions; applying a characteristic measuring voltage to measure characteristics of said plurality of surface-conduction emission devices; obtaining a reference value of the characteristics of said plurality of surface-conduction emission devices on the basis of the measured electron-emitting characteristics; and applying a characteristic shift voltage to a corresponding one of said plurality of surface-conduction emission devices such that the electron-emitting characteristics of said plurality of surface-conduction emission devices become values according to the reference value, wherein the characteristic shift voltage is higher than characteristic measuring voltage, and the characteristic measuring voltage is higher than the driving voltage.
Claim 8
Dependent Claim
32 words
The method according to claim 7, wherein the characteristic shift voltage is applied in an atmosphere in which a partial pressure of an organic gas is not more than 10 -8 Torr.
Claim 9
Dependent Claim
49 words
The method according to claim 7, further comprising the steps of measuring the characteristics of said plurality of surface-conduction emission devices again after application of the characteristic shift voltage, and applying the characteristic shift voltage to said corresponding surface-conduction emission device again on the basis of a remeasurement result.
Claim 10
Independent Claim
32 words
The method according to any one of claims 7, wherein the measuring step comprises measuring an emission current emitted from said surface-conduction emission device every time said surface-conduction emission device is driven.
Claim 11
Dependent Claim
29 words
The method according to claim 7, wherein the measuring step comprises measuring a device current flowing in said surface-conduction emission device every time said surface-conduction emission device is driven.
Claim 12
Dependent Claim
55 words
The method according to claim 7, wherein the measuring step comprises measuring a light emission luminance of the phosphor irradiated by the electron from said surface-conduction emission device every time said surface-conduction emission device is driven, and converting the measured luminance into a value corresponding to one of the emission current and the device current.
Claim 13
Dependent Claim
54 words
An electron generating apparatus comprising: a multi-electron-beam source in which a plurality of surface-conduction emission devices are arranged on a substrate; and driving means for driving said multi-electron-beam source on the basis of an image signal, wherein said electron generating apparatus is manufactured by a method of any one of claims 7 to 12.
Claim 14
Dependent Claim
28 words
An image forming apparatus comprising: an electron generating apparatus of claim 13; and a phosphor which emits light upon irradiation of an electron beam from said multi-electron-beam source.
References Cited (Backward Citations)
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