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EP0612103A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Method of manufacturing a silicon-on-insulator semiconductor device

Assignee: Samsung Electronics Co Ltd
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Filing: 1994-02-15
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Granted: —
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Expires: 2014-02-15
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Abstract

Abstract The present invention discloses a method for making a semiconductor device of silicon-on-insulator structure comprises the steps of: forming a pad oxide on a wafer including a lower silicon substrate, a buried oxide layer and an upper silicon layer, and forming an oxynitride region on a predetermined portion of the buried oxide layer; forming an active silicon layer to intersect the oxynitride region, and forming a cavity by wet-etching the exposed oxynitride region; forming a gate insulating layer on the surface of the exposed active silicon layer; forming a polysilicon to fill the cavity surrounding said active silicon layer and removing a predetermined portion of the doped polysilicon to form a gate electrode; and forming source and drain regions on the active silicon layer separated by the gate electrode.

Inventors

  • 👤 Tae Pok Rhee

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-29 21:06
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/6757; H10D30/01; H10D30/021; H10D30/031; H10D30/0321; H10D30/0323; H10D30/6729; H10D30/673; H10D30/6735; H10P; H10P14/00; H10P14/40; H10P14/416; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 130 words
A method for making a semiconductor device of silicon-on-insulator structure comprising the steps of: forming a pad oxide on a wafer including a lower silicon substrate, a buried oxide layer or a buried nitride layer, and an upper silicon layer, and forming an oxynitride region on a predetermined portion of said buried oxide layer; forming an active silicon layer to intersect said oxynitride region, and forming a cavity by wet-etching said exposed oxynitride region; forming a gate insulating layer on the surface of the exposed active silicon layer; forming a polysilicon to fill said cavity surrounding said active silicon layer and removing a predetermined portion of said doped polysilicon to form a gate electrode; and forming source and drain regions on said active silicon layer separated by said gate electrode.
Claim 2
Dependent Claim 15 words
The method according to claim 1, wherein said oxynitride region is formed by nitride ion-implantation.

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