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EP0561599A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Solid state image pickup apparatus with automatic correction of defective pixels

Assignee: Sony Corp
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Filing: 1993-03-15
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Granted: —
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Expires: 2013-03-15
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Abstract

Abstract A solid-state image pickup apparatus for use as a video camera has a defect detecting mode and an operation mode. The solid-state image pickup apparatus includes a solid-state image sensor (2) having pixels (I cr ) arranged in rows and columns for producing an output signal representing a detected image. The solid-state image sensor operates in a field reading mde for reading electric charges from the pixels in approximately one field period such that the electric charges of the pixels (I₄₁, I₃₁; I₄₂, I₃₂) of two adjacent columns are summed before being outputted from the solid-state image sensor, the summed electric charges being different in even and odd-numbered fields, and also operates in a frame reading mode for reading electric charges from the pixels in approximately one frame period such that the electric charges of the pixels (I₄₁, I₄₂; I₂₁, I₂₂) of one of two adjacent columns are read in even-numbered fields and the electric charges of the pixels (I₃₁, I₃₂; I₁₁, I₁₂) of the other of two adjacent columns are read in odd-numbered fields. The positions of defective pixels of the solid-state image sensor are detected in the defect detecting mode, the defective pixels causing noise in the output signal at corresponding times in sampled data of the output signal. The detected positions of the defective pixels are stored in a memory (13). When the defect detecting mode is selected, the solid-state image sensor is controlled to operate in the frame reading mode.

Inventors

  • 👤 Takashi c/o Sony Corporation Kameyama
  • 👤 Yuuji c/o Sony Corporation Ohba

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-07 05:20
CPC Classifications
H; H04; H04N; H04N23/00; H04N23/60; H04N23/667; H04N23/80; H04N23/84; H04N23/843; H04N25/00; H04N25/10; H04N25/40; H04N25/44; H04N25/441; H04N25/60; H04N25/68; H04N25/70; H04N25/71; H04N25/73; H04N23/10; H04N23/13

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 236 words
A solid-state image pickup apparatus having a defect detecting mode and an operation mode, comprising: a solid-state image sensor having pixels arranged in rows and columns for producing an output signal representing a detected image; drive means for driving said solid-state image sensor in a first reading mode for reading electric charges from said pixels in approximately one field period such that the electric charges of the pixels of two adjacent columns are summed before being outputted from said solid-state image sensor, the summed electric charges being different in even- and odd-numbered fields, and driving said solid-state image sensor in a second reading mode for reading electric charges from said pixels in approximately one frame period such that the electric charges of the pixels of one of two adjacent columns are read in even-numbered fields and the electric charges of the pixels of the other of two adjacent columns are read in odd-numbered fields; detecting means for detecting the positions of defective pixels of said solid-state image sensor in the defect detecting mode, said defective pixels causing noise in said output signal at corresponding times in sampled data of said output signal; memory means for storing the positions of the defective pixels detected by said detecting means; switch means for selecting said defect detecting mode; and control means for controlling said drive means to switch into said second reading mode while in said defect detecting mode.
Claim 2
Dependent Claim 67 words
A solid-state image pickup apparatus according to claim 1, further comprising a temperature sensor for detecting the temperature of said solid-state image sensor, and means for supplying one signal in a plurality of successive fields to read electric charges from said pixels into a charge transfer region of said solid-state image sensor when the detected temperature is lower than a predetermined temperature in said defect detecting mode.
Claim 3
Dependent Claim 49 words
A solid-state image pickup apparatus according to claim 1, further comprising a temperature sensor for detecting the temperature of said solid-state image sensor, and means for varying a threshold level used to detect the defective pixels with said detecting means, depending on the temperature detected by said temperature sensor.
Claim 4
Dependent Claim 53 words
A solid-state image pickup apparatus according to claim 1, further comprising a temperature sensor for detecting the temperature of said solid-state image sensor, and means for erasing the positions stored in said memory means when the temperature detected by said temperature sensor is lower than a predetermined temperature in said defect detecting mode.
Claim 5
Dependent Claim 35 words
A solid-state image pickup apparatus according to claim 1, further comprising means for forcibly stopping an electronic shutter to control an electric charge storage time of said solid-state image sensor in said defect detecting mode.
Claim 6
Dependent Claim 37 words
A solid-state image pickup apparatus according to claim 1, further comprising means for erasing the positions stored in said memory means when the defective pixels are not detected a predetermined number of times by said detecting means.
Claim 7
Dependent Claim 52 words
A solid-state image pickup apparatus according to claim 1, wherein said solid-state image sensor comprises a plurality of solid-state image sensor devices, further comprising means for stopping sampling the output signals from those solid-state image sensor devices whose defective pixels are not detected by said detecting means in said defect detecting mode.

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