EP0550135A2
Expired / Lapsed
EP
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Powered testing of mixed conventional/Boundary-Scan Logic
Assignee: HP Inc
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Filing: 1992-11-03
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Granted: —
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Expires: 2012-11-03
Abstract
Abstract The (X,Y) positions of the nodes 31A - 31C, 32A - 32C in a circuit 20 containing boundary scan components 22, 24 and non-boundary-scan components 26, 28 are stored in a computer 14. The computer 14 selects a set 32A - 32C of non-boundary scan nodes within a radius R of a selected boundary-scan node 31A, R being the length of solder bridges in the circuit. A logic 0 voltage is applied to the set 32A - 32C and a boundary-scan test is performed. If the boundary-scan test fails, a fault is declared in the circuit 20 between the set 32A - 32C and the selected boundary-scan node 31A. A logic 1 voltage is applied to one 32A of the nodes in the set 32A - 32C, and the test repeated. If the test returns different results, the fault is declared between that one node 32A and the selected boundary-scan node 31A.
Inventors
- 👤 Kenneth P. Parker
- 👤 Kenneth E. Posse
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-09 15:30
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318533; G01R31/318583; G01R31/318586
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
124 words
Apparatus 10 for boundary-scan testing of circuits 20 including at least one boundary-scan component 22 having at least one boundary-scan node 31A, said apparatus characterized by: set means 14, 16 for providing a set 30G, 30H, 30I of circuit elements within a radius R of a boundary-scan node 31A within said circuit 20 to be tested; test means 12, 14 comprising: driver means 35, 37 for applying a first predetermined electrical value to said set 30G, 30H, 30I of circuit elements; boundary scan means 12 for performing a boundary-scan test on said circuit 20; and output means 18 for providing an output indicative of the status of said circuit 20 between said boundary-scan node 31A and said set 30G, 30H, 30I of circuit elements.
Claim 2
Dependent Claim
55 words
Apparatus as in claim 1 characterized in that said circuit 20 includes boundary-scan circuit elements 30A - 30E and non-boundary-scan circuit elements 30G, 30H, 30I and said set means 14, 16 comprises means 14 for providing the set 30G, 30H, 30I of accessible non-boundary-scan circuit elements within said radius R of said boundary-scan node 31A.
Claim 3
Dependent Claim
21 words
Apparatus as in claim 2 characterized in that said set means 14, 16 comprises means 16 for selecting said radius R.
Claim 4
Dependent Claim
31 words
Apparatus as in claim 2 characterized in that said non-boundary-scan circuit elements 30G, 30H, 30I are pins 30G, 30H, 30I connected to non-boundary-scan nodes 32A, 32C, 32B of said circuit 20.
Claim 5
Dependent Claim
70 words
Apparatus as in claim 4 characterized in that said set means 14, 16 comprises; digital storage means 16 for storing the X-Y locations of all pins 30G, 30H, 30I connected to non-boundary-scan nodes 32A, 32C, 32B of said circuit 20; and digital processor means 14 communicating with said storage means 16 for determining which of said pins 30G, 30H, 30I are within a radius R of said boundary-scan node 31A.
Claim 6
Dependent Claim
25 words
Apparatus as in claim 1 characterized in that said radius R is a distance related to the length of solder bridges on said circuit 20.
Claim 7
Dependent Claim
41 words
Apparatus as in claim 1 and further characterized by resolving means 35, 37, 38, 54 for determining the status of said circuit 20 between said boundary-scan node 31A and one 30G of said set 30G, 30H, 30I of circuit elements .
Claim 8
Dependent Claim
111 words
Apparatus as in claim 8 characterized in that said resolving means 35, 37, 38, 54 comprises: means 54 for causing said drive means 35, 37 to apply a second predetermined electrical value to one circuit element 30G in said set 30G, 30H, 30I of circuit elements while applying said first predetermined electrical value to the other circuit elements 30I, 30H in said set 30G, 30I, 30H of circuit elements; means 54 for causing said boundary-scan means 12 to perform a second boundary-scan test on said circuit 20; and comparing means 54 for indicating whether the results of said first boundary-scan tests are different than the results of said second boundary-scan test.
Claim 9
Dependent Claim
23 words
Apparatus as in either one of claims 4 or 8 characterized in that said first predetermined electrical value is a logic 0 voltage.
Claim 10
Dependent Claim
115 words
Apparatus as in claim 1 characterized in that said test means 12, 14 further comprises; clock means 56 for counting time; power source means 40 for applying power to said circuit; clock initiation means 54 for initiating the count of said clock means upon application of power to said circuit; time limit means 14, 54 for providing a test time limit corresponding to the time for which a short circuit can be tolerated by said circuit; and power shutoff means 54, 34 communicating with said clock means 56 for turning off the power to said circuit 20 when the elapsed time since the application of power to said circuit 20 exceeds said test time limit.
References Cited (Backward Citations)
No citation records indexed.
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