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EP0489394A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Semiconductor integrated circuit

Assignee: Panasonic Holdings Corp
•
Filing: 1991-12-03
•
Granted: —
•
Expires: 2011-12-03
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Abstract

Abstract A semiconductor integrated circuit having a test circuit built therein is disclosed which comprises an A/D converter to be connected to an peripheral circuit, a digital circuit connected to the A/D converter, a digital signal switching device for connecting the output of the A/D converter and that of the digital circuit selectively and a boundary scan output circuit connected to the output of the digital signal switching device connects the A/D converter to the boundary scan output circuit in a normal mode and the signal fetched in the boundary scan output circuit are outputted therefrom in test mode. Semiconductor integrated circuits having an analog circuit built therein and an analog integrated circuit in which a test circuit is built-in are also disclosed.

Inventors

  • 👤 Kiyoshi 803 Lionsmansion Nijojo Higashi Imai
  • 👤 Toshiaki Tsuji
  • 👤 Taku Takada
  • 👤 Seiichi Taguchi

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-24 22:03
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/3167; H; H10; H10D; H10D89/00; H10D89/10; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318533; G01R31/318536; H03; H03M; H03M1/00; H03M1/12

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 125 words
A semiconductor integrated circuit comprising an A/D converter to be connected to an analog peripheral circuit; a digital circuit connected to the output side of said A/D converter; a digital signal switching device connected to the output side of said A/D converter and those of said digital circuit for switching the former to the latter or vice versa in accordance with a switching control signal applied thereto; and a boundary scan output circuit connected to the output side of said digital signal switching device which is operable in a normal mode in that outputs of said digital signal switching device are fetched thereinto and in a test mode in that the fetched outputs are outputted therefrom sequentially in response to a test signal applied thereto.
Claim 2
Dependent Claim 174 words
A semiconductor integrated circuit comprising an analog circuit to be connected to an analog peripheral circuit; an analog signal switching device for switching outputs of said analog peripheral circuit to those of said analog circuit or vice versa in accordance with a switching control signal applied thereto; an A/D converter connected to the output side of said analog signal switching device; a digital circuit connected to the output side of said A/D converter; a digital signal switching device connected to output side of both said A/D converter and said digital circuit for switching outputs of said A/D converter to those of said digital circuit or vice versa in accordance with a switching control signal applied thereto; and a boundary scan output circuit connected to the output side of said digital signal switching device which is operable in a normal mode in that outputs of said digital signal switching device are fetched thereto and in a test mode in that the fetched outputs are outputted therefrom sequentially in response to a test signal applied thereto.
Claim 3
Dependent Claim 106 words
A semiconductor integrated circuit including an analog integrated circuit being characterized in that said analog integrated circuit is comprised of an analog circuit to be connected to an analog peripheral circuit, an A/D converter connected, via a switching means, to both input and output sides of said analog circuit and a boundary scan output circuit connected to the output side of said A/D converter, and that said switching means connects the output of said analog circuit in a normal mode and switches the input of said analog peripheral circuit sequentially to said A/D converter in a test mode in response to a test signal applied thereto.

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