EP0463684A1
Expired / Lapsed
EP
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Test device for electric circuits on boards
Assignee: Koninklijke Philips NV
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Filing: 1991-06-18
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Granted: —
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Expires: 2011-06-18
Abstract
Abstract A device for testing an electric circuit or components of this circuit provided on a board (9), which board (9) is secured against a support (7) by an underpressure in a first chamber (15) during operation. An electrical connection is effected between the board (9) and an electronic test unit (69) of the device by means of a contact plate (81). The contact plate (81) is provided exchangeably on a partition wall (13) which hermetically seals off the first chamber (15) from a second chamber (17) and which can be moved in a direction transverse to the board (9) by a pressure difference between the two chambers (15, 17). The exchangeable contact plate (81) corresponds to the type of board (9) and activates a combination of test probes (49) from a set of test probes (49) provided in a matrix plate (45), which combination is unique for the type of board (9), after the partition wall (13) has been moved. In this way a functional test of the entire circuit on the board (9) and/or a component test can be carried out by means of the device.
Inventors
- 👤 Robert Karel Atheur Van Klooster
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-01 19:49
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314; G01R1/07328
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
148 words
A device for testing electric circuits provided on boards and components of electric circuits provided on boards, in which device during operation a board comprising electric components to be tested fixedly lies against a support of the device as a result of an underpressure, in a first chamber, and a contact plate which is movable in a direction transverse to the board is in a position in which the board is electrically connected to a test unit of the device as a result of a pressure difference between the first chamber and a second chamber, characterized in that the contact plate is exchangeably provided on a partition wall which hermetically seals off the first chamber from the second chamber and which is movable under the influence of a pressure difference between the two chambers after a predetermined hold-down force between the board and the support has been obtained.
Claim 2
Independent Claim
148 words
A device for testing electric circuits provided on boards and components of electric circuits provided on boards, in which device during operation a board comprising electric components to be tested fixedly lies against a support of the device as a result of an underpressure, in a first chamber, and a contact plate which is movable in a direction transverse to the board is in a position in which the board is electrically connected to a test unit of the device as a result of a pressure difference between the first chamber and a second chamber, characterized in that the contact plate is exchangeably provided on a partition wall which hermetically seals off the first chamber from the second chamber and which is movable under the influence of a pressure difference between the two chambers after a predetermined hold-down force between the board and the support has been obtained.
Claim 3
Dependent Claim
66 words
A device as claimed in Claim 1, characterized in that the device is provided with a set of test probes extending in a direction perpendicular to the board, a subset of test probes from this set for the board under test being in contact with a combination of contact points of the board corresponding to the said subset during operation after moving of the contact plate.
Claim 4
Dependent Claim
80 words
A device as claimed in Claim 2, characterized in that the test probes are provided in a grid arrangement of bores which extend in a direction transverse to the board in a matrix plate between the support and the contact plate, each test probe being movable in the relevant bore by means of the contact plate, while each test probe has at least one test pin which is movable relative to the test probe by means of the contact plate.
Claim 5
Dependent Claim
91 words
A device as claimed in Claim 1, 2 or 3, characterized in that the device is provided with a set of connection probes extending in a direction perpendicular to the contact plate and fixed in bores of a connection plate extending parallel to the contact plate, which connection probes are electrically connected to the test unit of the device, a subset of the connection probes being in contact with a combination of contact points of the contact plate corresponding to the said subset during operation after moving of the contact plate.
Claim 6
Dependent Claim
75 words
A device as claimed in Claim 4, characterized in that the contact plate is provided with a printed circuit by means of which a first set of contact points of the contact plate, which are in contact with the connection probes after moving of the contact plate, is electrically connected to a second set of contact points of the contact plate, which are in contact with the test probes after moving of the contact plate.
Claim 7
Independent Claim
31 words
A device as claimed in any one of the Claims 1 to 5, characterized in that equal underpressures can be set simultaneously in the first chamber and in the second chamber.
Claim 8
Independent Claim
35 words
A device as claimed in any one of the Claims 1 to 6, characterized in that a pressure can be set in the second chamber which is higher than an ambient pressure surrounding the device.
References Cited (Backward Citations)
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