EP0432291A1
Expired / Lapsed
EP
⏱️ 0.0 years remaining
IC test equipment
Assignee: Advantest Corp
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Filing: 1989-12-12
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Granted: —
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Expires: 2009-12-12
Abstract
Abstract In equipment which measures current of ICs for testing them, there are provided a first current detector (300) for detecting current which flows through an IC under test (100) when applying voltage from a voltage source (200) to a power source terminal of the IC to which a smoothing capacitor (600) is connected, a buffer amplifier (50) for extracting the voltage to be appiied to the power source terminal, a compensating capacitor (700) which is supplied with the output of the buffer amplifier (50) and provides a charging/discharging current equivalent to that which flows through the smoothing capacitor (600), a second current detector (800) for detecting the charging/discharging current of the compensating capacitor, and a subtractor (900) for subtracting the output of the second current detector (800) from the output of the first current detector (300). By substracting the charging/discharging current of the compensating capacitor from the current flowing from the voltage source to the IC under test, the current flowing to the IC under test can be measured without being affected by the charging/discharging current of the smoothing capacitor.
Inventors
- 👤 Yoshihiro Hashimoto
- 👤 Shoji Yamazaki
- 👤 Shunsuke Katoh
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-10-31 13:17
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/30; G01R31/3004
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
134 words
An IC test equipment comprising: a voltage source for applying a predetermined power source voltage to an IC under test; first current detecting means for detecting current flowing from said voltage source to said IC under test; a smoothing capacitor for smoothing pulsations of said voltage applied to said IC under test which are caused by its operation; compensating means for generating a current equivalent to a charging/discharging current which flows through said smoothing capacitor when voltage is applied to a power source terminal of said IC under test; second current detecting means for detecting said current generated by said compensating means; and calculating means for subtracting the detected outputs of said first and second current detecting means one from the other to obtain the value of current flowing through said IC under test.
Claim 2
Dependent Claim
134 words
An IC test equipment comprising: a voltage source for applying a predetermined power source voltage to an IC under test; first current detecting means for detecting current flowing from said voltage source to said IC under test; a smoothing capacitor for smoothing pulsations of said voltage applied to said IC under test which are caused by its operation; compensating means for generating a current equivalent to a charging/discharging current which flows through said smoothing capacitor when voltage is applied to a power source terminal of said IC under test; second current detecting means for detecting said current generated by said compensating means; and calculating means for subtracting the detected outputs of said first and second current detecting means one from the other to obtain the value of current flowing through said IC under test.
Claim 3
Dependent Claim
70 words
The IC test equipment of claim 1 wherein said compensating means includes a buffer amplifier for extracting said voltage to be applied to said power source terminal of said IC under test, without exerting any influence on said voltage, and a compensating capacitor which is supplied with the output voltage of said buffer amplifier and charges and discharges said current equivalent to said charging/discharging current flowing through said smoothing capacitor.
Claim 4
Dependent Claim
97 words
The IC test equipment of claim 1 further comprises a voltage follower amplifier which is connected via a signal line of a coaxial cable to said power source terminal of said IC under test and forms a feedback path through which said voltage to be applied to said power source terminal is fed back to said voltage source, and a guard amplifier which has its input terminal connected to said feedback path and its output connected to an outer conductor of said coaxial cable and operates said outer conductor and said signal line equipotential to each other.
Claim 5
Dependent Claim
28 words
The IC test equipment of claim 3 wherein said compensating means includes a compensating capacitor connected to said guard amplifier and said outer conductor of said coaxial cable.
Claim 6
Dependent Claim
75 words
The IC test equipment of claim 3 wherein said compensating means includes a buffer amplifier which has its input terminal connected to said feedback path and extracts said voltage to be applied to said power source terminal, without exerting any influence on said voltage, and a compensating capacitor which is supplied with the output voltage of said buffer amplifier and charges and discharges said current equivalent to said charging/-discharging current flowing through said smoothing capacitor.
Claim 7
Dependent Claim
42 words
The IC test equipment of claim 2 or 5 wherein said second current detecting means includes a current detecting resistor connected in series to the output side of said buffer amplifier and a differential amplifier extracting voltage across said current detecting resistor.
Claim 8
Dependent Claim
41 words
The IC test equipment of claim 4 wherein said second current detecting means includes a current detecting resistor connected in series to the output side of said guard amplifier and a differential amplifier for extracting voltage across said current detecting resistor.
Claim 9
Dependent Claim
29 words
The IC test equipment of claim 5 wherein the output side of said buffer amplifier and said compensating capacitor are connected via another signal line of said coaxial cable.
Claim 10
Dependent Claim
48 words
The IC test equipment of claim 5 wherein the output side of said buffer amplifier and said compensating capacitor are connected via a signal line of another coaxial cable and said outer conductor of said coaxial cable is connected to an outer conductor of said another coaxial cable.
Claim 11
Dependent Claim
32 words
The IC test equipment of claim 2, 4, 5, 8, or 9 wherein said compensating capacitor is of the same kind and the same electrostatic capacitance as those of said smoothing capacitor.
References Cited (Backward Citations)
No citation records indexed.
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