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EP0424926A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Bi-CMOS integrated circuit

Assignee: Toshiba Corp
•
Filing: 1990-10-24
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Granted: —
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Expires: 2010-10-24
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Abstract

Abstract There is disclosed a Bi-CMOS integrated circuit including an NPN-type (8, 15, 16) bipolar transistor, a P-MOS transistor (9, 17, 20), an N-MOS transistor (11, 18, 21) which are formed on the same substrate, wherein an N-type region (1, 2, 4, 9) is formed so that a P-type isolation region for isolating the NPN-type bipolar transistor and the MOS transistor is electrically isolated from the P-type region for the N-MOS transistor. In such a structure, since different bias potentials can be applied to the P-type isolation region and the P-type region for the N-MOS transistor, respectively, high speed operation can be attained without any erroneous operation.

Inventors

  • 👤 Hideki Yamada
  • 👤 Makoto Segawa
  • 👤 Kiminobu Suzuki
  • 👤 Kiyoshi Kobayashi
  • 👤 Shigeto Mizukami
  • 👤 Yasumitsu Nozawa

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-29 12:55
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/40; H10D84/401; H10D84/01; H10D84/0107; H10D84/0109

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 90 words
A Bi-CMOS integrated circuit comprising: an NPN transistor (8, 15, 16) formed on a substrate surface, and a CMOS transistor comprised of a P-channel MOS transistor (9, 17, 20) and an N-channel MOS transistor, (11, 18, 21) formed on said substrate surface, and characterized in that said circuit further comprises an N-type region (1, 2, 4, 9) for isolation for electrically isolating a P-type region for isolation between bipolar/CMOS adjoining an N-type region serving as the collector of said NPN transistor and a P-type region of said P-channel MOS transistor.
Claim 2
Dependent Claim 90 words
A Bi-CMOS integrated circuit comprising: an NPN transistor (8, 15, 16) formed on a substrate surface, and a CMOS transistor comprised of a P-channel MOS transistor (9, 17, 20) and an N-channel MOS transistor, (11, 18, 21) formed on said substrate surface, and characterized in that said circuit further comprises an N-type region (1, 2, 4, 9) for isolation for electrically isolating a P-type region for isolation between bipolar/CMOS adjoining an N-type region serving as the collector of said NPN transistor and a P-type region of said P-channel MOS transistor.
Claim 3
Dependent Claim 38 words
A Bi-CMOS integrated circuit as set forth in claim 1, wherein said N-type region for isolation is comprised of an N-type substrate (1) and an N-type region (9) of said P-channel MOS transistor provided on the surface thereof.
Claim 4
Dependent Claim 80 words
A Bi-CMOS integrated circuit as set forth in claim 1, wherein said NPN transistor and said CMOS transistor are formed within a P-type epitaxial layer (7) formed on the surface of an N-type substrate, and wherein said N-type region for isolation is comprised of said N-type substrate, an N-type well formed within said p-type epitaxial layer on the surface of said N-type substrate, and an N-type region for said P-channel MOS transistor formed within a P-type epitaxial layer formed thereon.
Claim 5
Dependent Claim 39 words
A Bi-CMOS integrated circuit as set forth in claim 3, wherein an N-type buried layer (2) is provided between said N-type substrate and an N well formed within said P-type epitaxial layer on the surface of said N-type substrate.
Claim 6
Dependent Claim 42 words
A Bi-CMOS integrated circuit as set forth in claim 1, wherein said N-type region for isolation is composed of an N-type substrate (1) and an N-type trench region (30) formed so that its bottom portion is in contact with said N-type substrate.
Claim 7
Dependent Claim 38 words
A Bi-CMOS integrated circuit as set forth in claim 1, wherein different bias voltages are applied to said N-type region serving as said collector of said NPN transistor and said P-type region of said P-channel MOS transistor, respectively.
Claim 8
Dependent Claim 26 words
A Bi-CMOS integrated circuit as set forth in claim 6, wherein bias generation means (40) for generating different bias voltages is provided on the same chip.

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