EP0401848A2
Expired / Lapsed
EP
⏱️ 0.0 years remaining
Tape carrier and test method therefor
Assignee: Toshiba Corp
•
Filing: 1990-06-08
•
Granted: —
•
Expires: 2010-06-08
Abstract
Abstract A tape carrier comprises contact test patterns (3₁, 3₂) used for performing a conduction test on a tape base (2). More specifically, in addition to test pads (3) connected to outer leads used for input/output signals, the contact test patterns (3₁, 3₂) are formed on the tape base to test whether socket contactors (11) are in contact with the test pads (3). A conduction test is performed using the contact test patterns. The tape is repeatedly reset to the socket until a conductive state is established, thereby preventing a test error.
Inventors
- 👤 Akito C/O Intellectual Property Div. Yoshida
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-05 02:29
CPC Classifications
H; H10; H10P; H10P74/00; H10P74/27; H10P74/273; H10P74/23; H10W; H10W70/00; H10W70/60; H10W70/67; H10W70/688
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
26 words
A tape carrier comprising: a tape base (2); and a contact test patterns (3₁, 3₂) formed on said tape base, used for performing a conduction test.
Claim 2
Dependent Claim
26 words
A tape carrier comprising: a tape base (2); and a contact test patterns (3₁, 3₂) formed on said tape base, used for performing a conduction test.
Claim 3
Dependent Claim
25 words
A tape carrier according to claim 1, characterized in that said contact test patterns (3₁, 3₂) are formed near a corner of said tape base.
Claim 4
Dependent Claim
32 words
A tape carrier according to claim 1, characterized in that said contact test patterns (3₁, 3₂) are formed in a process in which other patterns (3) are formed on said tape base.
Claim 5
Independent Claim
55 words
A method of testing a tape carrier including a tape base (2) and a contact test patterns (3₁, 3₂) formed on said tape base (2), used for performing a conduction test, comprising a step of performing a conduction test of said contact test patterns when a non-defective/defective discrimination test is performed for the tape carrier.
Claim 6
Independent Claim
55 words
A method of testing a tape carrier including a tape base (2) and a contact test patterns (3₁, 3₂) formed on said tape base (2), used for performing a conduction test, comprising a step of performing a conduction test of said contact test patterns when a non-defective/defective discrimination test is performed for the tape carrier.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
Maintenance schedule is calculated for granted US utility patents.