Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
93 words
In a semiconductor laser device which emits laser light from an end facet, comprising a multi-layered structure formed on a semiconductor substrate, said multi-layered structure having an active layer for laser oscillation, and a pair of cleavage planes on the side of the multi-layered structure, the device wherein a graded-band-gap layer is formed on at least one of said cleavage planes said graded-band-gap layer having a forbidden band gap which increases gradually with an increase in the distance from said cleavage plane, and the surface of said graded-band-gap layer constituting said end facet.
Claim 2
Dependent Claim
93 words
In a semiconductor laser device which emits laser light from an end facet, comprising a multi-layered structure formed on a semiconductor substrate, said multi-layered structure having an active layer for laser oscillation, and a pair of cleavage planes on the side of the multi-layered structure, the device wherein a graded-band-gap layer is formed on at least one of said cleavage planes said graded-band-gap layer having a forbidden band gap which increases gradually with an increase in the distance from said cleavage plane, and the surface of said graded-band-gap layer constituting said end facet.
Claim 3
Dependent Claim
37 words
A semiconductor laser device according to claim 1, wherein said active layer is made of Ga 1-x Al x As (0 ≦ x ≦ 1) and said graded-band-gap layer is made of Ga 1-y Al y As.
Claim 4
Dependent Claim
35 words
A semiconductor laser device according to claim 2, wherein the Al mole fraction y of said graded-band-gap layer increases from the cleavage plane to the end facet in accordance with the linear or parabolic distribution.
Claim 5
Dependent Claim
34 words
A semiconductor laser device according to claim 3, wherein the Al mole fraction y at the cleavage plane between the active layer and the graded-band-gap layer is equal to the Al mole fraction x.
Claim 6
Dependent Claim
34 words
A semiconductor laser device according to claim 3, wherein the Al mole fraction y at the cleavage plane between the active layer and the graded-band-gap layer is greater than the Al mole fraction x.
Claim 7
Dependent Claim
34 words
A semiconductor laser device according to claim 3, wherein the Al mole fraction y at the cleavage plane between the active layer and the graded-band-gap layer is smaller than the Al mole fraction x.
Claim 8
Dependent Claim
82 words
A method for the production of a semiconductor laser device of claim 1, comprising forming a multi-layered structure on a semiconductor substrate, said multi-layered structure having an active layer for laser oscillation; cleaving the substrate together with the multi-layered structure to form a laser cavity between cleavage planes; and forming a graded-band-gap layer on at least one of said cleavage planes, said graded-band-gap layer having a forbidden band gap which increases gradually with an increase in the distance from said cleavage plane.
Claim 9
Dependent Claim
16 words
A method according to claim 7, wherein said graded-band-gap layer is grown by vapor phase epitaxy.