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EP0347739A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Scanning tunneling microscope and surface topographic observation method

Assignee: Hitachi Ltd
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Filing: 1989-06-14
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Granted: —
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Expires: 2009-06-14
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Abstract

Abstract In a surface topographic observation method using a scanning tunneling microscope, a probe (2) is moved away from the surface (5a) of a sample (5) and is moved on a plane to move it successively to points of measurement on the sample surface in order to obtain texture information of the sample. That is, the probe (2) is moved on a plane completely preventing the probe tip from colliding with the sample surface (5a) and enabling the probe to effect scanning at high speeds.

Inventors

  • 👤 Sumio Hosaka
  • 👤 Shigeyuki Hosoki
  • 👤 Keiji Takata
  • 👤 Tsuyoshi Hitachi-Dai4Kyoshin-Ryo 4-14-6 Hasegawa

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-02 04:28
CPC Classifications
G; G01; G01Q; G01Q60/00; G01Q60/02; G01Q60/04; B; B82; B82Y; B82Y35/00; G01B; G01B7/00; G01B7/34; Y; Y10; Y10S; Y10S977/00; Y10S977/84; Y10S977/849; Y10S977/85; Y10S977/851

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 57 words
A surface topographic observation method using a scanning tunneling microscope, wherein when a probe (2) is to be suc­cessively moved to points of measurement on the surface (5a) of a sample (5) to obtain texture information of the sample, the probe is once moved away from the surface of the sample and is moved on a plane.
Claim 2
Dependent Claim 57 words
A surface topographic observation method using a scanning tunneling microscope, wherein when a probe (2) is to be suc­cessively moved to points of measurement on the surface (5a) of a sample (5) to obtain texture information of the sample, the probe is once moved away from the surface of the sample and is moved on a plane.
Claim 3
Dependent Claim 51 words
The method of claim 1, wherein the probe (2) is brought close to the sample (5), and the texture information of the sample is obtained from the elongation of the probe at a mo­ment when a tunnel current that flows across the probe and the sample has reached a desired value.
Claim 4
Dependent Claim 20 words
The method of claim 2, wherein the probe (2) is brought close to the sample (5) at a constant speed.
Claim 5
Dependent Claim 29 words
The method of claim 2 or 3, wherein the probe (2) is brought close to the sample (5) by a servo mechanism (8...12) to maintain the tunnel current constant.
Claim 6
Dependent Claim 151 words
A scanning tunneling microscope comprising: means (8) for measuring a current that flows across a sample (5) and a probe (2), means (6, 7, 14) for two-dimensionally scanning said probe (2) on the surface (5a) of said sample (5), means (1) for changing the distance in the vertical di­rection between said sample surface (5a) and the tip of said probe (2), servo means (8...12) which adjusts the gap between said sample surface (5a) and said probe (2) such that said current becomes constant, and means (11, 15...19) for obtaining information on said sample surface (5a) from the displacement of said probe (2) in the vertical direction at each of said points of measurement, wherein said scanning means (6, 7, 14) effects the scanning among said points of measurement with said probe (2) moved away from said sample surface (5a), and said servo means (8...12) functions only at said points of measurement.
Claim 7
Dependent Claim 151 words
A scanning tunneling microscope comprising: means (8) for measuring a current that flows across a sample (5) and a probe (2), means (6, 7, 14) for two-dimensionally scanning said probe (2) on the surface (5a) of said sample (5), means (1) for changing the distance in the vertical di­rection between said sample surface (5a) and the tip of said probe (2), servo means (8...12) which adjusts the gap between said sample surface (5a) and said probe (2) such that said current becomes constant, and means (11, 15...19) for obtaining information on said sample surface (5a) from the displacement of said probe (2) in the vertical direction at each of said points of measurement, wherein said scanning means (6, 7, 14) effects the scanning among said points of measurement with said probe (2) moved away from said sample surface (5a), and said servo means (8...12) functions only at said points of measurement.
Claim 8
Dependent Claim 61 words
The microscope of claim 5, comprising means (1) which moves said probe (2) away from the sample surface (5a) when the current that is a tunnel current reaches a setpoint value, and means (11, 15...19) which obtains texture information on said sample surface (5a) from the displacement of said probe (2) in the vertical direction when said setpoint value is de­tected.
Claim 9
Dependent Claim 70 words
The microscope of claim 6, comprising means which, after the tunnel current is detected, measures physical information such as a current corresponding to a tunnel voltage, a con­ductance or a differential conductance under the condition where the probe (2) is at rest, and means which, after the physical information is measured, moves the probe (2) away from the sample (5) and then transfers it to the next position of measurement.

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