Method of testing a fleeting programmable memory, and this memory

Abstract

Abstract The invention relates to memories which can be programmed just once, known as OTP memories. <??>When they are encapsulated in a plastic housing, these electrically programmable memories can no longer be erased. It is therefore not possible to program them in order to test them before selling them to the customer since they must be delivered unprogrammed. <??>In order to be able to carry out certain tests, in particular of speed of access, it is proposed to simulate the programming of certain points whilst prohibiting the reading of these points when they are designated by the decoder. The memory then behaves as if it included both unprogrammed points and programmed points (those whose reading voltage is disabled), whereas in fact it includes only unprogrammed points. A very simple logic circuit (10, 12, TL1 to TL4) makes it possible to simulate a chessboard pattern of programmed and unprogrammed points. <IMAGE>

Inventors

• 👤 Jean-Marie Gaultier
• 👤 Augustin Farrugia
• 👤 Bertrand Conan

Bibliographic Details