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EP0322465A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Method of epitaxially growing a substrate for highly bright led

Assignee: Mitsubishi Chemical Corp
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Filing: 1988-07-06
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Granted: —
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Expires: 2008-07-06
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Abstract

Abstract A substrate for a highly bright LED and a method of epitaxially growing the same employ an AuZn alloy as an oh­mic electrode for a p-type Al x Ga 1-x As layer (2), and are based upon the fact that the contact resistance decreases with an increase in the carrier concentration in the above layer and accordingly the voltage (V F ) required for a forward current of 20 mA decreases. When a vapor phase growth method and a liquid phase growth method are used in combination, an ep­itaxial layer grown by the vapor phase growth method (MOCVD method, MBE method etc.) has a carrier concentration which is 3 to 5 times as great as that of the epitaxial layer formed by the liquid phase growth method (LPE method) and the reproducibility is good. The p-type Al x Ga 1-x As layer (2) is used as a contact layer for the electrode to decrease the con tact resistance while suppressing variance. ABSTRACT A substrate for a high-intensity LED and the method of epitaxially growing the substrate according to the invention are based on the fact that, in using an AuZn alloy or the like as the ohmic electrode of the p-type Al x Ga 1-x As layer (2), the higher the carrier concentration of this layer, the smaller the contact resistance and the lower the applied voltage (V F ) necessary for passing a forward current of 10 mA. Joint use is made of gas-phase epitaxy and liquid-phase epitaxy. A layer having a carrier concentration three to five times that of an epitaxial layer formed by liquid-phase epitaxy (LPE) can be realized with excellent reproducibility by gas-phase epitaxy (MOCVD process, MBE process, etc.). By utilizing this p-type Al x Ga 1-x As layer (2) as an electrode contact layer, contact resistance can be reduced and variance diminished.

Inventors

  • 👤 Masahiro Mitsubishi Monsanto Chem.Comp. Noguchi

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-05 15:08
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/83; H10H20/832; H10H20/01; H10H20/011; H10H20/013; H10H20/81; H10H20/822; H10H20/824; Y; Y10; Y10S; Y10S148/00; Y10S148/099; Y10S148/108; Y10S148/135

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 48 words
A high-intensity LED comprising a p-type Al x Ga 1-x As layer (x≧0.3) having a carrier concentration of more than 5 x 10¹⁷ cm⁻³ and a thickness of 3 - 7 µm, and a hetero structure epitaxial layer formed on said p-type Al x Ga 1-x As layer.
Claim 2
Dependent Claim 48 words
A high-intensity LED comprising a p-type Al x Ga 1-x As layer (x≧0.3) having a carrier concentration of more than 5 x 10¹⁷ cm⁻³ and a thickness of 3 - 7 µm, and a hetero structure epitaxial layer formed on said p-type Al x Ga 1-x As layer.
Claim 3
Independent Claim 74 words
A method of epitaxially growing a substrate for a high-intensity LED, comprising a first step of forming a p-type Al x Ga 1-x As layer (x≧0.3) having a carrier concentration of more than 5 x 10¹⁷ cm⁻³ on a GaAs substrate to a thickness of 3 - 7 µm by gas-phase epitaxy, a second step of forming a hetero structure epitaxial layer by liquid-phase epitaxy, and a third step of removing the GaAs substrate.
Claim 4
Independent Claim 74 words
A method of epitaxially growing a substrate for a high-intensity LED, comprising a first step of forming a p-type Al x Ga 1-x As layer (x≧0.3) having a carrier concentration of more than 5 x 10¹⁷ cm⁻³ on a GaAs substrate to a thickness of 3 - 7 µm by gas-phase epitaxy, a second step of forming a hetero structure epitaxial layer by liquid-phase epitaxy, and a third step of removing the GaAs substrate.
Claim 5
Dependent Claim 62 words
A method of epitaxially growing a substrate for a high-intensity LED according to claim 2, wherein 1 - 5 µm of the epitaxial layer, which is formed by gas-phase epitaxy of the first step, is melted back using an unsaturated melt when liquid-phase epitaxy of said second step is performed, thereby eliminating the influence of an oxide film formed on the surface.
Claim 6
Dependent Claim 63 words
A method of epitaxially growing a substrate for a high-intensity LED according to claim 2, wherein a mixed crystal ratio X of a p-type Al x Ga 1-x As cladding layer is set to be higher than a mixed crystal ratio of a hetero structure active layer, and such that 0.3≦X≦0 holds, when growth is performed by liquid-phase epitaxy of said second step.
Claim 7
Independent Claim 31 words
A method of epitaxially growing a substrate for a high-intensity LED according to any one of claims 2 through 4, wherein a Zn-doped GsAs substrate is used as the GaAs substrate.

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