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EP0299185A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Thin film field effect transistor

Assignee: International Business Machines Corp
•
Filing: 1988-05-31
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Granted: —
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Expires: 2008-05-31
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Abstract

Abstract A thin film transistor that includes a substrate (1); gate electrode (2); thin film semiconductor (4) insulated from the gate electrode (2); and a bias control electrode (9) is provided. The bias control electrode (9) is a p-n junction or a Schottky barrier that contacts the thin film semiconductor (4).

Inventors

  • 👤 Marc H. Brodsky
  • 👤 Frank F. Fang

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-30 16:24
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/80; H10D30/87; H10D30/875; H10D30/83; H10D30/832

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 72 words
A thin film field effect transistor comprising a substrate (1); gate electrode (2); a thin film semiconductor material (4) insulated from said gate electrode (2); and a bias control electrode (9) that forms at least one of a p-n junction and a Schottky barrier contacting said thin film semiconductor material (4) and wherein said thin film semiconductor material (4) is located intermediate said gate electrode (2) and said bias control electrode (9).
Claim 2
Dependent Claim 72 words
A thin film field effect transistor comprising a substrate (1); gate electrode (2); a thin film semiconductor material (4) insulated from said gate electrode (2); and a bias control electrode (9) that forms at least one of a p-n junction and a Schottky barrier contacting said thin film semiconductor material (4) and wherein said thin film semiconductor material (4) is located intermediate said gate electrode (2) and said bias control electrode (9).
Claim 3
Dependent Claim 20 words
The thin film field effect transistor of claim 1 wherein said gate electrode (9) is located adjacent said substrate (1).
Claim 4
Dependent Claim 21 words
The thin film field effect transistor of claim 1 wherein said bias control electrode (9) is located adjacent said substrate (1).
Claim 5
Dependent Claim 17 words
The thin film field effect transistor of claim 1 or 2 wherein said substrate (1) is glass.
Claim 6
Dependent Claim 25 words
The thin film field effect transistor of claims 1 to 4 wherein said semiconductor material (4) is polycrystalline silicon, amorphous silicon, or hydrogenated amorphous silicon.
Claim 7
Dependent Claim 20 words
The thin film field effect transistor of claims 1 to 5 wherein said bias control electrode is a p-n junction.
Claim 8
Dependent Claim 18 words
The thin film field effect transistor of claims 1 to 6 wherein said gate electrode is a metal.
Claim 9
Dependent Claim 17 words
The thin film field effect transistor of claim 7 wherein said gate electrode is aluminum or chromium.
Claim 10
Dependent Claim 37 words
The thin film field effect transistor of claims 1 to 8 wherein said thin film semiconductor material (4) is insulated from said gate (2) electrode by a layer (3) of silicon dioxide, or silicon nitride, or both.

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