EP0287501A2
Expired / Lapsed
EP
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Method for predicting life expectancy of materials
Assignee: Mitsubishi Heavy Industries Ltd
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Filing: 1988-03-02
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Granted: —
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Expires: 2008-03-02
Abstract
Abstract A new method for predicting life expectancy of a metal part used under stress is disclosed. A particular crystal on a polished surface of the part is selected and studied with its electron channeling pattern image to find how much strain is accumulated on a crystal scale. The quality of the image is quantified so that a straightforward relationship between the image quality and strain is found and used to determine the timing of replacement of the part.
Inventors
- 👤 Takashi Takasago Technical Institute Nishida
- 👤 Masanori Kobe Shipyard & Engine Tashimo
- 👤 Masaaki Kobe Shipyard & Engine Ogino
- 👤 Takanori-R&D Laboratories-Ii Nakazawa
- 👤 Syuichi R&D Laboratories Ii Funaki
- 👤 Tuneo Osaka Sales Office Kuroki
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-10-30 11:18
CPC Classifications
G; G01; G01N; G01N17/00; G01N23/00; G01N23/22; G01N23/225; G01N23/2251; G01N15/00; G01N15/10; G01N15/14; G01N15/1468; G01N33/00; G01N33/20; G01N33/204
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
135 words
A method for predicting life expectancy comprising: A polishing means for finely polishing, as a pretreatment, a surface of a part that is put under stress; A selection means for selecting a crystal with a large amount of information by processing an electron beam diffracted from said polished surface of said part with the above polishing means to obtain an electron channeling contrast image; An imaging means for obtaining an electron channeling pattern image of the crystal with a large amount of information selected by the above selection means; and A prediction means for predicting the consumption of lifetime of said part up to the time of measurement from the quality of electron channeling pattern image obtained by the above imaging means and using a predetermined relationship between the image quality and strain in crystals.
Claim 2
Independent Claim
135 words
A method for predicting life expectancy comprising: A polishing means for finely polishing, as a pretreatment, a surface of a part that is put under stress; A selection means for selecting a crystal with a large amount of information by processing an electron beam diffracted from said polished surface of said part with the above polishing means to obtain an electron channeling contrast image; An imaging means for obtaining an electron channeling pattern image of the crystal with a large amount of information selected by the above selection means; and A prediction means for predicting the consumption of lifetime of said part up to the time of measurement from the quality of electron channeling pattern image obtained by the above imaging means and using a predetermined relationship between the image quality and strain in crystals.
Claim 3
Dependent Claim
38 words
The method for predicting life expectancy described in Claim 1 further comprising an image processing means for binary coding and quantifying, together with filters, the quality of said electron channeling pattern image obtained by the above imaging means.
Claim 4
Independent Claim
33 words
The method for predicting life expectancy described in any of the above claims further comprising a relating means for relating the measured strain to the timing of replacement and reexamination of said part.
References Cited (Backward Citations)
No citation records indexed.
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