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EP0277764A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Test system for electronic devices

Assignee: Westinghouse Electric Corp
•
Filing: 1988-01-27
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Granted: —
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Expires: 2008-01-27
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Abstract

Abstract A test system for comparatively analyzing a complex signal indicative of the operational status of an electronic device to be tested includes means (36) for sampling a signal whose characteristics are indicative of the unknown operational status of the electronic device to produce a comparison data base. The comparison data base is processed by a microcomputer (20) to produce comparison transform coefficients. These transform coefficients are compared with a set of reference transform coefficients, representative of a desired operational status of the device, to determine the actual operational status of the device. The sampling means is electrically connected to a conductive element (24) capacitively coupled to the device and permanently mounted in a fixed spatial relationship with the device.

Inventors

  • 👤 Robert Allen Boenning

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-09 14:10
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/22; G06F11/26; G06F11/273; G06F11/277; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/312

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 130 words
A test system for comparatively analyzing a complex signal indicative of the operational status of an electronic device to be tested comprising in combination: means (36) for sampling a signal whose characteristics are indicative of an unknown operational status of an electron­ic device to produce a comparison data base; means (20) for processing said comparison data base to produce comparison transform coefficients, and for comparing said comparison transform coefficients with a plurality of reference transform coefficients representative of a desired opera­tional status of said device to determine the actual operational status of said electronic device; characterized in that said means for sampling said signal is electrically connected to a conductive element (24) capacitively coupled to said electronic device and permanently mounted in a fixed spatial relationship with said electronic device.
Claim 2
Dependent Claim 130 words
A test system for comparatively analyzing a complex signal indicative of the operational status of an electronic device to be tested comprising in combination: means (36) for sampling a signal whose characteristics are indicative of an unknown operational status of an electron­ic device to produce a comparison data base; means (20) for processing said comparison data base to produce comparison transform coefficients, and for comparing said comparison transform coefficients with a plurality of reference transform coefficients representative of a desired opera­tional status of said device to determine the actual operational status of said electronic device; characterized in that said means for sampling said signal is electrically connected to a conductive element (24) capacitively coupled to said electronic device and permanently mounted in a fixed spatial relationship with said electronic device.
Claim 3
Dependent Claim 25 words
A test system as recited in claim 1, further characterized in that said conductive element is embedded in an insulating housing of said electronic device.
Claim 4
Dependent Claim 26 words
A test system as recited in claim 1, further characterized in that said conductive element is rigidly attached to an external surface of said electronic device.

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