EP0274155A1
Expired / Lapsed
EP
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Microscope
Assignee: Koninklijke Philips NV
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Filing: 1987-12-07
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Granted: —
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Expires: 2007-12-07
Abstract
Abstract A scanning differential phase contrast microscope is described in which an objective system (20) focusses the radiation from a radiation source (10) to a preferably diffraction-limited spot (A) in an object plane (30). The diffraction-limited spot is imaged on two point detectors (63+61 and 64+62) via an imaging system (40) and a beam divider (60). By using this confocal principle, a differential phase contrast microscope is obtained having a low sensitivity to details which are out of focus, an increased resolution in the object plane and little crosstalk between the two detectors.
Inventors
- 👤 Jozef Petrus Henricus Benschop
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-05 09:11
CPC Classifications
G; G02; G02B; G02B21/00; G02B21/0004; G02B21/002; G02B21/0024; G02B21/0052; G02B21/0056; G02B21/06; G02B21/08; G02B21/14; G02B27/00; G02B27/28; G02B27/283
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
130 words
A scanning microscope for observing an object placed in an object plane, comprising a coherent radiation source, an objective system for focussing radiation emitted by the radiation source to a radiation spot in the object plane and a radiation-sensitive detection system comprising two radiation detectors which are arranged in such a way that radiation from the two discrete halves of the radiation beam originating from the radiation spot is detected by a different detector, characterized in that the detectors are point detectors separated from each other, in that a beam divider is arranged in the radiation path from the object plane to the radiation detectors and in that an imaging system with which the object plane is imaged on the detector is arranged between the object plane and each detector.
Claim 2
Dependent Claim
130 words
A scanning microscope for observing an object placed in an object plane, comprising a coherent radiation source, an objective system for focussing radiation emitted by the radiation source to a radiation spot in the object plane and a radiation-sensitive detection system comprising two radiation detectors which are arranged in such a way that radiation from the two discrete halves of the radiation beam originating from the radiation spot is detected by a different detector, characterized in that the detectors are point detectors separated from each other, in that a beam divider is arranged in the radiation path from the object plane to the radiation detectors and in that an imaging system with which the object plane is imaged on the detector is arranged between the object plane and each detector.
Claim 3
Dependent Claim
20 words
A microscope as claimed in Claim 1, characterized in that the beam divider is constituted by a double optical wedge.
Claim 4
Dependent Claim
39 words
A microscope as claimed in Claim 1 or 2, in which the radiation reflected by the object is detected, characterized in that a beam splitter is arranged in the radiation path from the radiation source to the object plane.
Claim 5
Dependent Claim
57 words
A microscope as claimed in Claim 3, characterized in that the radiation source is suitable for emitting a linearly polarized beam, in that the beam splitter is a polarization-sensitive beam splitter and in that a λ/4 plate is arranged between the beam splitter and the object plane, in which λ is the wavelength of the radiation used.
Claim 6
Dependent Claim
27 words
A microscope as claimed in Claim 3 or 4, characterized in that the objective system and the imaging system have at least one optical element in common.
Claim 7
Dependent Claim
25 words
A microscope as claimed in Claim 3, 4 or 5, characterized in that beam-deflecting means are arranged between the beam splitter and the object plane.
References Cited (Backward Citations)
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