Transport system for a testing device for electronic components

Abstract

Abstract This system can be precisely set for use with different sizes of components without replacing parts. The length and width of the cross- section of the conveyor sections are set by means of adjustable rails via spindle drives with micrometer precision. A magazine head (40) with several magazine insert openings (42) (also adjustable) can be displaced with respect to a feed chute (36) which transfers the components to the test station (26), for alignment of the individual parallel insert openings (42) with the feed chute (14) in which the components (41) slide down. After testing, the components (41) slide down individually into a distributor (17) with a transversely adjustable diverter for distributing the components according to the test result into the output chutes (18). These are also in parallel and have a common positioning mechanism for their rails for adjusting the cross-section. The rails for the guide chute and the output chutes are, like the diverter, adjusted in a precisely reproducible manner via spindle drives (62a, 70a). From input to output, the components (41) run through a linear conveyor section without deflection except at the diverter. The inclination of this linear section is adjustable to the most favourable slip angle for different types of component (Fig 3). <IMAGE>

Inventors

• 👤 Konstantin Gerganoff

Bibliographic Details