EP0248521A2
Expired / Lapsed
EP
⏱️ 0.0 years remaining
Electrical contactors
Assignee: Plessey Overseas Ltd
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Filing: 1987-04-24
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Granted: —
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Expires: 2007-04-24
Abstract
Abstract An electrical contactor for (fig 2) testing high frequency integrated circuits including a centre plate (l4) with resilient conductive paths (26) therethrough and upper and lower plates (l0, l2) with contact pins (20) aligned with the conductive paths (26) to contact an integrated circuit (l8) to be tested and a test board (22). The resilient conductive paths (26) may be provided eg by pads of metal impregnated silicon rubber or by phosphor-bronze wool inserts.
Inventors
- 👤 David Christopher Saunders
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-02 00:42
CPC Classifications
H; H01; H01R; H01R12/00; H01R12/70; H01R12/71; H01R12/712; H01R12/714; G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
109 words
An electrical contactor for high frequency integrated circuits including a first plate, a second plate with a centre plate sandwiched therebetween, the first plate and the second plate being provided with through holes corresponding in position to points to be tested on an integrated circuit to be tested and in which the centre plate includes a plurality of isolated conductive regions of resilient conductive material in positions within the centre plate corresponding to the through holes in the first and second plates, a plurality of conductive pins being provided through the through holes in the first and second plates to provide contacts to the integrated circuit to be tested.
Claim 2
Dependent Claim
109 words
An electrical contactor for high frequency integrated circuits including a first plate, a second plate with a centre plate sandwiched therebetween, the first plate and the second plate being provided with through holes corresponding in position to points to be tested on an integrated circuit to be tested and in which the centre plate includes a plurality of isolated conductive regions of resilient conductive material in positions within the centre plate corresponding to the through holes in the first and second plates, a plurality of conductive pins being provided through the through holes in the first and second plates to provide contacts to the integrated circuit to be tested.
Claim 3
Dependent Claim
25 words
An electrical contactor as claimed in claim l in which the resilient conductive material is a metal loaded silicon rubber or a phosphor-bronze wire fuzz.
Claim 4
Dependent Claim
41 words
An electrical contactor as claimed in claim l or claim 2 in which the isolated conductive regions are positioned within through holes in the centre plate, which holes are plated with a conductive material to improve the conductivity of the regions.
Claim 5
Dependent Claim
35 words
An electrical contactor as claimed in any one of the preceding claims in which the first, second and centre plates are formed in ceramic material, the through holes being accurately drilled or spark eroded therethrough.
Claim 6
Dependent Claim
35 words
An electrical contactor as claimed in any one of the preceding claims including a guide ring positioned adjacent the first plate, the guide ring forming a positional guide for an integrated circuit to be tested.
References Cited (Backward Citations)
No citation records indexed.
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