Temperature compensated complementary metal-insulator-semiconductor oscillator

Claim 2

A temperature compensated metal-insulator-semiconductor current source fabricated as a monolithic integrated circuit on a semiconductor die, comprising: means for receiving electrical energy; means for summing a temperature stable reference voltage and a threshold voltage to produce a bias voltage; and means for biasing a metal-insulator-semiconductor field effect transistor with a difference between said bias voltage and a temperature dependent voltage across a p-n semiconductor junction to generate a substantially temperature independent current through said metal-insulator-semiconductor field effect transistor.

Claim 3

A temperature compensated metal-insulator-semiconductor current source fabricated as a monolithic integrated circuit on a semiconductor die, as defined in claim 1, wherein said means for summing includes a second metal-insulator-semiconductor field effect transistor which receives said temperature stable reference voltage and generates said threshold voltage.

Claim 4

A temperature compensated metal-insulator-semiconductor current source fabricated as a monolithic integrated circuit on a semiconductor die, as defined in claim 1, wherein said p-n semiconductor junction comprises a bipolar diode connected between a source electrode of said metal-insulator-semiconductor field effect transistor and a ground to provide a temperature dependent forward voltage drop which compensates for temperature varia tions in said metal-insulator-semiconductor field effect transistor.

Claim 5

A temperature compensated metal-insulator-semiconductor current source fabricated as a monolithic integrated circuit on a semiconductor die, as defined in claim 3, wherein said means for summing includes a second metal-insulator-semiconductor field effect transistor biased by said temperature stable reference voltage and being energized to produce said threshold voltage.

Claim 6

A temperature compensated complementary metal-oxide-semiconductor current source, comprising: means for summing a temperature stable reference voltage with a threshold voltage to produce a bias voltage; and an enhancement mode metal-oxide-semiconductor field effect transistor having a gate electrode receiving said bias voltage and having a source electrode connected to a p-n junction and biased thereby with a temperature dependent forward voltage in order to compensate for temperature changes in said metal-oxide-semiconductor field effect transistor whereby said metal-oxide-semiconductor field effect transistor generates a substantially temperature independent current.

Claim 7

A temperature compensated complementary metal-oxide-semiconductor current source, comprising: means for summing a temperature stable reference voltage with a threshold voltage to produce a bias voltage; and an enhancement mode metal-oxide-semiconductor field effect transistor having a gate electrode receiving said bias voltage and having a source electrode connected to a p-n junction and biased thereby with a temperature dependent forward voltage in order to compensate for temperature changes in said metal-oxide-semiconductor field effect transistor whereby said metal-oxide-semiconductor field effect transistor generates a substantially temperature independent current.

Claim 8

A temperature compensated complementary metal-oxide-semiconductor current source, as defined in claim 5, wherein said means for summing includes a second metal-oxide-semiconductor field effect transistor which receives said temperature stable reference voltage and produces said threshold voltage.

Claim 9

A temperature compensated complementary metal-oxide-semiconductor current source, as defined in claim 6, wherein said second metal-oxide-semiconductor field effect transistor has a channel width of not less than ten times its channel length, said metal-oxide-semiconductor field effect transistor having a drain-source circuit energized by a small current so that said bias voltage exceeds said temperature stable reference voltage by an amount equal to said threshold voltage.

Claim 10

A temperature compensated complementary metal-oxide-semiconductor current source, comprising: means for receiving electrical energy; means for receiving a temperature stable reference voltage; means for attenuating said temperature stable reference voltage to produce a temperature stable attenuated voltage; means for adding said temperature stable attenuated voltage to a threshold voltage of a first metal-oxide-semiconductor field effect transistor to produce a first bias voltage; a second metal-oxide-semiconductor field effect transistor having a gate electrode biased by said first bias voltage and a source electrode biased by a temperature dependent forward voltage drop formed across a p-n junction whereby to generate a temperature independent current flowing through a drain electrode and said source electrode of said second metal-oxide-semiconductor field effect transistor.

Claim 11

A temperature compensated complementary metal-oxide-semiconductor current source, comprising: means for receiving electrical energy; means for receiving a temperature stable reference voltage; means for attenuating said temperature stable reference voltage to produce a temperature stable attenuated voltage; means for adding said temperature stable attenuated voltage to a threshold voltage of a first metal-oxide-semiconductor field effect transistor to produce a first bias voltage; a second metal-oxide-semiconductor field effect transistor having a gate electrode biased by said first bias voltage and a source electrode biased by a temperature dependent forward voltage drop formed across a p-n junction whereby to generate a temperature independent current flowing through a drain electrode and said source electrode of said second metal-oxide-semiconductor field effect transistor.

Claim 12

A temperature compensated metal-oxide-semiconductor oscillator fabricated as a monolithic integrated circuit on a semiconductor die, comprising: means for receiving electrical energy; means for summing a temperature stable reference voltage and a threshold voltage to produce a bias voltage; means for biasing a metal-oxide-semiconductor field effect transistor with a difference between said bias voltage and a temperature dependent voltage across a p-n semiconductor junction to generate a current through said metal-oxide-semiconductor field effect transistor which is substantially temperature independent; and means for producing an oscillating electrical signal receiving said substantially temperature independent current to be energized thereby, whereby said oscillating electrical signal has a substantially temperature independent period.

Claim 13

A temperature compensated metal-oxide-semiconductor oscillator fabricated as a monolithic integrated circuit on a semiconductor die, comprising: means for receiving electrical energy; means for summing a temperature stable reference voltage and a threshold voltage to produce a bias voltage; means for biasing a metal-oxide-semiconductor field effect transistor with a difference between said bias voltage and a temperature dependent voltage across a p-n semiconductor junction to generate a current through said metal-oxide-semiconductor field effect transistor which is substantially temperature independent; and means for producing an oscillating electrical signal receiving said substantially temperature independent current to be energized thereby, whereby said oscillating electrical signal has a substantially temperature independent period.

Claim 14

A temperature compensated metal-oxide-semiconductor oscillator fabricated as a monolithic integrated circuit on a semiconductor die, as defined in claim 9, wherein said means for summing includes a second metal-oxide-semiconductor field effect transistor receiving said temperature stable reference voltage at a source electrode thereof and producing a voltage at a drain electrode thereof which exceeds the source voltage by an amount substantially equal to said threshold voltage.

Claim 15

A temperature compensated metal-oxide-semiconductor oscillator fabricated as a monolithic integrated circuit on a semiconductor die, as defined in claim 10, wherein said p-n semiconductor junction comprises a bipolar diode connected between a source of ground potential and a source electrode of said first metal-oxide-semiconductor field effect transistor.

Claim 16

A temperature compensated complementary metal-oxide-semiconductor oscillator, comprising: means for summing a temperature stable reference voltage with a threshold voltage to produce a bias voltage; an enhancement mode metal-oxide-semiconductor field effect transistor having a gate electrode receiving said bias voltage and having a source electrode connected to a p-n junction to be biased thereby with a temperature dependent voltage to generate a current which is substantially temperature independent; and means for producing an oscillating electrical signal being energized by said substantially independent current whereby said oscillating electrical signal has a period which is substantially temperature independent.

Claim 17

A temperature compensated complementary metal-oxide-semiconductor oscillator, comprising: means for summing a temperature stable reference voltage with a threshold voltage to produce a bias voltage; an enhancement mode metal-oxide-semiconductor field effect transistor having a gate electrode receiving said bias voltage and having a source electrode connected to a p-n junction to be biased thereby with a temperature dependent voltage to generate a current which is substantially temperature independent; and means for producing an oscillating electrical signal being energized by said substantially independent current whereby said oscillating electrical signal has a period which is substantially temperature independent.

Claim 18

A temperature compensated complementary metal-oxide-semiconductor oscillator, as defined in claim 12, wherein said means for summing comprises a second metal-oxide-semiconductor field effect transistor receiving said temperature stable reference voltage at a source electrode thereof and being energized by a current of less than two microamperes whereby said bias voltage is produced at a drain electrode of said second metal-oxide-semiconductor field effect transistor thereof.

Claim 19

A temperature compensated complementary metal-oxide-semiconductor oscillator, as defined in claim 13, wherein said second metal-oxide-semiconductor field effect transistor has a channel width not less than ten times its channel length.

Claim 20

A temperature compensated complementary metal-oxide-semiconductor oscillator, comprising: means for receiving electrical energy; means for receiving a temperature stable reference voltage; means for attenuating said temperature stable voltage reference signal to produce a temperature stable attenuated voltage; means for adding said temperature stable attenuated voltage to a threshold voltage of a first metal-oxide-semiconductor field effect transistor to produce a first bias voltage; a second metal-oxide-semiconductor field effect transistor having a gate electrode biased by said first bias voltage and a source electrode biased by a temperature dependent forward voltage drop across a p-n junction whereby to generate a temperature independent current flowing through a drain electrode and said source electrode of said second metal-oxide-semiconductor field effect transistor; and means for producing an oscillating electrical signal being energized by said temperature independent current so that a period of said oscillating electric signal is substantially temperature independent.

Claim 21

A temperature compensated complementary metal-oxide-semiconductor oscillator, comprising: means for receiving electrical energy; means for receiving a temperature stable reference voltage; means for attenuating said temperature stable voltage reference signal to produce a temperature stable attenuated voltage; means for adding said temperature stable attenuated voltage to a threshold voltage of a first metal-oxide-semiconductor field effect transistor to produce a first bias voltage; a second metal-oxide-semiconductor field effect transistor having a gate electrode biased by said first bias voltage and a source electrode biased by a temperature dependent forward voltage drop across a p-n junction whereby to generate a temperature independent current flowing through a drain electrode and said source electrode of said second metal-oxide-semiconductor field effect transistor; and means for producing an oscillating electrical signal being energized by said temperature independent current so that a period of said oscillating electric signal is substantially temperature independent.

Claim 22

A temperature compensated complementary metal-oxide-semiconductor oscillator, as defined in claim 15, wherein said p-n junction comprises a bipolar diode connected to a source of ground potential and connected to said source electrode of said second metal-oxide-semiconductor field effect transistor so that said temperature dependent forward voltage drop compensates for a temperature dependent change in said second metal-oxide-semiconductor field effect transistor.

Claim 23

A temperature compensated complementary metal-oxide-semiconductor oscillator, as defined in claim 15, wherein said means for producing an oscillating electric signal comprises a capacitor adapted to be charged by said temperature independent current and a Schmitt trigger connected to said capacitor for providing an oscillator output signal.

Claim 24

A temperature stabl e complementary metal-oxide-semiconductor oscillator for use as a clock, comprising: a voltage divider receiving a temperature stable reference voltage from a source of temperature stable reference voltage and producing an attenuated temperature stable attenuated voltage; a first metal-oxide-semiconductor field effect transistor connected to said voltage divider to receive said temperature stable reference voltage at a gate electrode thereof to control a magnitude of a first current flowing between a first drain electrode thereof and a first source electrode thereof; a first current mirror connected to said first metal-oxide-semiconductor field effect transistor and having said first current flowing therethrough, said first current mirror producing a second current proportional to said first current; a second metal-oxide-semiconductor field effect transistor having a second gate electrode, a second source electrode and a second drain electrode, said second gate electrode and said second drain electrode of said second metal-oxide-semiconductor field effect transistor being connected together and receiving said second current, said second source electrode being connected to said voltage divider to receive said temperature stable attenuated voltage, said second metal-oxide-semiconductor field effect transistor developing a bias potential at a junction of said second gate electrode and said second drain electrode equal to a sum of said temperature stable attenuated voltage and a threshold voltage; a third metal-oxide-semiconductor field effect transistor having a third gate electrode, a third drain electrode and a third source electrode and being connected at said third gate electrode to said junction and receiving said bias voltage, said drain electrode being coupled to a source of current; a p-n junction bipolar diode connected to said third source electrode to bias said third source electrode with a temperature dependent forward voltage across said bipolar diode to compensate for a temperature dependent variation in a characteriestic of said third metal-oxide-semiconductor field effect transistor, said third metal-oxide-semiconductor field effect transistor being thereby biased to produce a drain to source current which is substantially temperature independent; and a Schmitt trigger oscillator receiving said constant temperature independent current and being driven thereby so that said Schmitt trigger oscillator has a constant temperature independent period.

Claim 25

A temperature stabl e complementary metal-oxide-semiconductor oscillator for use as a clock, comprising: a voltage divider receiving a temperature stable reference voltage from a source of temperature stable reference voltage and producing an attenuated temperature stable attenuated voltage; a first metal-oxide-semiconductor field effect transistor connected to said voltage divider to receive said temperature stable reference voltage at a gate electrode thereof to control a magnitude of a first current flowing between a first drain electrode thereof and a first source electrode thereof; a first current mirror connected to said first metal-oxide-semiconductor field effect transistor and having said first current flowing therethrough, said first current mirror producing a second current proportional to said first current; a second metal-oxide-semiconductor field effect transistor having a second gate electrode, a second source electrode and a second drain electrode, said second gate electrode and said second drain electrode of said second metal-oxide-semiconductor field effect transistor being connected together and receiving said second current, said second source electrode being connected to said voltage divider to receive said temperature stable attenuated voltage, said second metal-oxide-semiconductor field effect transistor developing a bias potential at a junction of said second gate electrode and said second drain electrode equal to a sum of said temperature stable attenuated voltage and a threshold voltage; a third metal-oxide-semiconductor field effect transistor having a third gate electrode, a third drain electrode and a third source electrode and being connected at said third gate electrode to said junction and receiving said bias voltage, said drain electrode being coupled to a source of current; a p-n junction bipolar diode connected to said third source electrode to bias said third source electrode with a temperature dependent forward voltage across said bipolar diode to compensate for a temperature dependent variation in a characteriestic of said third metal-oxide-semiconductor field effect transistor, said third metal-oxide-semiconductor field effect transistor being thereby biased to produce a drain to source current which is substantially temperature independent; and a Schmitt trigger oscillator receiving said constant temperature independent current and being driven thereby so that said Schmitt trigger oscillator has a constant temperature independent period.

Claim 26

A temperature stable complementary metal-oxide-semiconductor oscillator for use as a clock, as defined in claim 18, wherein each of said metal-oxide-semiconductor field effect transistors is an enhancement mode metal-oxide-semiconductor field effect transistor.