EP0197157A1
Expired / Lapsed
EP
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Method of determining thickness and composition of alloy film
Assignee: JFE Steel Corp
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Filing: 1985-10-03
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Granted: —
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Expires: 2005-10-03
Abstract
Abstract A method of determining the thickness and composition of an alloy film consisting of one layer which contains a metal identical with a substrate metal, or two layers of different composition, which method is suitably used to analyze a steel plate coated with a one- or two-layer Zn-Fe alloy film. The characteristic X-rays and white X-rays are applied to an object alloy film (112, 10, 210) to detect an angle of diffraction (20) of the characteristic X-rays diffracted due to an intermetallic compound in the alloy film. The composition of the alloy is determined on the basis of this angle of diffraction. The intensity of the fluorescent X-rays, which are based on the white X-rays from the object film is detected, and the thickness of the film is measured at the same time on the basis of the intensity of the fluorescent X-rays and the above-mentioned composition of the film.
Inventors
- 👤 Tadahiro Abe
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-02 08:39
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N23/223; G01B; G01B15/00; G01B15/02; G01N2223/00; G01N2223/07; G01N2223/076
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
138 words
L. A method of measuring the thickness and the composition of alloy plating, wherein, in measuring the thickness and the composition of one layer alloy plating including a metal identical with a substrate metal: characteristic X-rays and white X-rays irradiate an object (112) to be measured, a diffraction angle (20) of diffracted X-rays of said characteristic X-rays, which is diffracted by an intermetallic compound of said alloy plating is detected from said diffraction angle, to measure the composition of said alloy plating from said diffraction angle; an intensity of fluorescent X-rays from a metal different from said substarate metal in said alloy plating, the fluorescent X-rays being generated by the white X-rays, is detected, and the thickness of said alloy plating is simultaneously measured from the intensity of the fluorescent X-rays and the composition of said alloy plating.
Claim 2
Dependent Claim
36 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 1, wherein said one layer alloy plating is a Zn-Fe one layer alloy plating applied onto a steel plate.
Claim 3
Dependent Claim
34 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 1, wherein said characteristic X-rays and said white X-rays are generated from a single X-ray source (114).
Claim 4
Dependent Claim
31 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 3, wherein said single X-ray source is an X-ray tube (114) of Cr target.
Claim 5
Dependent Claim
44 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 1, wherein said characteristic X-rays are generated from an X-ray tube of Cr target and said white X-rays are generated from an X-ray tube of W target.
Claim 6
Dependent Claim
28 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 1, wherein an incident angle (ψ) of said X-rays is minimized.
Claim 7
Independent Claim
195 words
A method of measuring the thickness and the composition of alloy plating, wherein, in measuring the thickness and the composition of an alloy plating having two layers different in composition from each other and including a metal identical with a substrate metal: characteristic X-rays and white X-rays irradiate an object (10, 210) to be measured; a diffraction angle (2&) of diffracted X-rays by an intermetallic compound of a first layer (bottom layer) of the alloy plating, is detected, and the composition (W 2 ) of said first layer of the alloy plating is measured from said diffraction angle; and intensities of fluorescent X-rays from a substrate metal, a metal identical with said substrate metal in the alloys plating and a metal different from said substrate metal in the alloy plating, said fluorescent X-rays being generated by said white X-rays, are respectively detected by two measuring angles (ψ 1 and ψ 2 ), and the thickness (T l and T 2 ) of alloy plating of said first layer and a second layer (top layer) are simultaneously measured from said intensities of said fluorescent X-rays and the composition of said first layer of the alloy plating.
Claim 8
Dependent Claim
51 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 7, wherein said two layers of alloy plating include a first layer of Zn-Fe alloy plating and a second layer of Fe plating having Fe as the chief content applied onto a steel plate.
Claim 9
Dependent Claim
35 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 7, wherein said characteristic X-rays and said white X-rays are generated from a single X-ray source (12, 212).
Claim 10
Dependent Claim
32 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 9, wherein said single X-ray source is an X-ray tube (12, 212) of Cr target.
Claim 11
Dependent Claim
44 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 7, wherein said characteristic X-rays are generated from an X-ray tube of Cr target, and said white X-rays are generated from an X-ray tube of W target.
Claim 12
Dependent Claim
28 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 7, wherein an incident angle (ψ) of said X-rays is minimized.
References Cited (Backward Citations)
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