Integrated circuit device

Abstract

Abstract An integrated circuit device comprises combinational circuits and sequential circuits; the sequential circuits each is provided with a (common) input control signal terminal (16) for controlling the permission to input main input terminal signals into the sequential circuit, a test data input/output terminal (17-1,17-2), a read/write signal terminal (8-1,8-2,8-3,9-1,9-2,9-3) for controlling the transfer of the test data, and a latch circuit. The integrated circuit device is partitioned into sequential circuits groups (1',2',3'), and combinational circuit groups (4,5,6) used as partitioning test units, the main input-output terminal groups of which are connected with the sequential circuits groups through wiring layers (11,13,15), test data are written and read out, from and to the sequential circuits groups under control of read/write signal lines through bus lines (17-1,17-2) dedicated to testing. Thus, a higher fault-coverage ratio can be easily obtained with smaller number of steps and small test circuits areas.

Inventors

• 👤 Shigeo Kuboki
• 👤 Ikuro Masuda
• 👤 Toshiaki Masuda
• 👤 Terumine Hayashi

Bibliographic Details