EP0150260A2
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EP
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Method for sensing and simulating digital logic states
Assignee: Valid Logic Systems Inc
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Filing: 1984-08-24
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Granted: —
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Expires: 2004-08-24
Abstract
Abstract In an apparatus for simulating operation of digital circuit systems, a method for sensing signal values at device terminals comprises comparing the drive level of an output terminal with the drive level of a high impedance source.
Inventors
- 👤 Curtis L. Widdoes, Jr.
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-10-29 16:18
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/22; G06F11/26; G06F11/261; G06F30/00; G06F30/30; G06F30/32; G06F30/33
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
140 words
In an apparatus for simulating operation of a digital circuit system, a method for detecting the presence of a high impedance condition on a terminal of a complex digital device in said digital circuit system wherein a physical specimen of said complex circuit device is employed as an operational reference element, said method comprising the steps of: driving said terminal with high impedance current source having a first voltage level representative of a first binary value; sensing voltage level at said terminal to determine a third binary value; driving said terminal with high impedance current source having second voltage level representative of a second binary value; sensing voltage level at said terminal to determine a fourth binary value; and designating said terminal as being in a high impedance condition where said fourth binary value differs from said third binary value.
Claim 2
Dependent Claim
140 words
In an apparatus for simulating operation of a digital circuit system, a method for detecting the presence of a high impedance condition on a terminal of a complex digital device in said digital circuit system wherein a physical specimen of said complex circuit device is employed as an operational reference element, said method comprising the steps of: driving said terminal with high impedance current source having a first voltage level representative of a first binary value; sensing voltage level at said terminal to determine a third binary value; driving said terminal with high impedance current source having second voltage level representative of a second binary value; sensing voltage level at said terminal to determine a fourth binary value; and designating said terminal as being in a high impedance condition where said fourth binary value differs from said third binary value.
Claim 3
Dependent Claim
38 words
The method according to claim 1 further including the step of designating said terminal as being in a condition corresponding to said first binary value where said first binary value is the same as said third binary value.
Claim 4
Dependent Claim
38 words
The method according to claim 1 further including the step of designating said terminal as being in a condition corresponding to said second binary value where said second binary value is the same as said fourth binary value-
Claim 5
Dependent Claim
142 words
In an apparatus for simulating operation of a digital circuit system, a method for detecting the presence of a high impedance condition on a terminal of a complex digital device in said digital circuit system wherein a physical specimen of said complex circuit device is employed as an operational reference element, said method comprising the steps of: driving said terminal with a high impedance current source toward a first voltage level representative of a first binary value; sensing level of voltage at said terminal to determine binary value; driving said terminal with said current source toward a second voltage level representation of a second binary value; sensing level of voltage at said terminal to determine binary value; and designating binary value at said terminal as corresponding to said first binary value or to said second binary value in accordance with said sensing.
Claim 6
Dependent Claim
142 words
In an apparatus for simulating operation of a digital circuit system, a method for detecting the presence of a high impedance condition on a terminal of a complex digital device in said digital circuit system wherein a physical specimen of said complex circuit device is employed as an operational reference element, said method comprising the steps of: driving said terminal with a high impedance current source toward a first voltage level representative of a first binary value; sensing level of voltage at said terminal to determine binary value; driving said terminal with said current source toward a second voltage level representation of a second binary value; sensing level of voltage at said terminal to determine binary value; and designating binary value at said terminal as corresponding to said first binary value or to said second binary value in accordance with said sensing.
References Cited (Backward Citations)
No citation records indexed.
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