EP0148086B1
Expired / Lapsed
EP
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Background charge suppression in a solid state photosensitive device
Assignee: Thales SA
•
Filing: 1984-12-21
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Granted: 1987-09-30
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Expires: 2004-12-21
Abstract
No abstract record available.
Inventors
- 👤 Marc Thomson-Csf Arques
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-09 19:19
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/15; H10F39/157; H10F39/1575; H10D; H10D44/00; H10D44/40; H10D44/45; H10D44/452
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
204 words
Background charge suppression method for a photosensitive solid state device comprising N photodetectors (1) embodied on a first substrate and connected to a reading stage through a transition zone comprising at least one storing zone formed beneath a storing gate (G ST ) as well as a transfer gate (G T ) and a multiplexer (R) of charge transfer type, wherein at least the transition zone and the multiplexer are embodied on a second substrate (2), characterized in that the second substrate (2) is polarized to a negative voltage (V SM ) with respect to that (V SD ) of the first substrate, and having performed the integration of the charges and their transfer to the multiplexer in the usual manner leaving a charge Q o in the storing zone, the transfer gate (G T ) is polarized so that the potential of this gate is lower than the polarization voltage of the first substrate (V SD ), and then the storing gate (G ST ) is polarized so that the potential beneath this gate is comprised between the polarization voltage of the first substrate and the potential beneath the transfer gate, in order to evacuate the charge Q o to the photodetectors (1).
Claim 2
Dependent Claim
204 words
Background charge suppression method for a photosensitive solid state device comprising N photodetectors (1) embodied on a first substrate and connected to a reading stage through a transition zone comprising at least one storing zone formed beneath a storing gate (G ST ) as well as a transfer gate (G T ) and a multiplexer (R) of charge transfer type, wherein at least the transition zone and the multiplexer are embodied on a second substrate (2), characterized in that the second substrate (2) is polarized to a negative voltage (V SM ) with respect to that (V SD ) of the first substrate, and having performed the integration of the charges and their transfer to the multiplexer in the usual manner leaving a charge Q o in the storing zone, the transfer gate (G T ) is polarized so that the potential of this gate is lower than the polarization voltage of the first substrate (V SD ), and then the storing gate (G ST ) is polarized so that the potential beneath this gate is comprised between the polarization voltage of the first substrate and the potential beneath the transfer gate, in order to evacuate the charge Q o to the photodetectors (1).
Claim 3
Dependent Claim
41 words
Background charge suppression method according to claim 1, characterized in that the potential beneath the transfer gate (G T ) during evacuation of the charge Q o is selected equal to the polarization voltage (V SM ) of the second substrate.
Claim 4
Dependent Claim
28 words
Background charge suppression method according to any of claims 1 and 2, characterized in that the voltage (V SD ) of the first substrate is equal to ground.
Claim 5
Dependent Claim
39 words
Background charge suppression method according to any of claims 1 to 3, characterized in that the photodetectors, the transition zone and the shift register are embodied on the same substrate separated in first and second substrates by insulating means.
References Cited (Backward Citations)
No citation records indexed.
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