EP0144680A1
Expired / Lapsed
EP
⏱️ 0.0 years remaining
IC device and a system for testing the same
Assignee: Toshiba Corp
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Filing: 1984-10-24
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Granted: —
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Expires: 2004-10-24
Abstract
Abstract An IC device (11) wherein a source (12) of IC device type-distinguishing data is provided on an IC chip (11), and a section (14 On ) for drawing out the IC device type-distinguishing data is connected to said source (12) of IC device type-distinguishing data formed on said IC chip (11).
Inventors
- 👤 Soichi C/O Patent Division Suzuki
- 👤 Mitsuo C/O Patent Division Aihara
- 👤 Mitsuo C/O Patent Division Fujii
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-01 22:22
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/31903; G01R31/31908; G06; G06F; G06F11/00; G06F11/006; H; H10; H10W; H10W46/00; H10W46/401; H10W46/403; H10W46/601
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
64 words
An IC device comprising: a data source (12) for distinguishing between the types of IC devices, said source (12) being provided as an IC chip (11) while being previously supplied with IC device type-distinguishing data; and a section (14 0n ) for drawing out said IC device type-distinguishing data, said section being connected to the source of said data provided on said IC chip.
Claim 2
Dependent Claim
64 words
An IC device comprising: a data source (12) for distinguishing between the types of IC devices, said source (12) being provided as an IC chip (11) while being previously supplied with IC device type-distinguishing data; and a section (14 0n ) for drawing out said IC device type-distinguishing data, said section being connected to the source of said data provided on said IC chip.
Claim 3
Dependent Claim
28 words
The IC device according to claim 1, characterized in that said source (12) of IC device type-distinguishing data is formed of a ROM having a plurality of bits.
Claim 4
Dependent Claim
37 words
The IC device according to claim 1, characterized in that said section (14 0n ) for drawing out said IC device type-distinguishing data is formed of a pad provided at the end of the IC chip (11).
Claim 5
Dependent Claim
43 words
The IC device according to claim 1, characterized in that said section (14 0n ) for drawing out said IC device type-distinguishing data consists of a pin (22 0n ) projecting from an IC body (21) constructed by packaging the IC chip (11).
Claim 6
Dependent Claim
37 words
The IC device according to claim 1, characterized in that said section (14 0n ) for drawing out said IC device type-distinguishing data can be selectively used with at least the ordinary data input or output terminal.
Claim 7
Dependent Claim
100 words
An IC device-testing system comprising: means (35) for judging IC device type-distinguishing data, which reads out IC device type-distinguishing data provided in an IC device under testing (11, 21) and determines the contents of said data; test program-reading means (33) which read out a test program corresponding to the result of said determination of the contents of the IC device type-distinguishing data from among a plurality of test programs previously stored in a data source (32); and testing means (34, 35, 36) which tests the IC device in accordance with the test program read out by said test program-reading means.,
Claim 8
Dependent Claim
100 words
An IC device-testing system comprising: means (35) for judging IC device type-distinguishing data, which reads out IC device type-distinguishing data provided in an IC device under testing (11, 21) and determines the contents of said data; test program-reading means (33) which read out a test program corresponding to the result of said determination of the contents of the IC device type-distinguishing data from among a plurality of test programs previously stored in a data source (32); and testing means (34, 35, 36) which tests the IC device in accordance with the test program read out by said test program-reading means.,
Claim 9
Dependent Claim
39 words
The IC device-testing system according to claim 6, characterized in that said test program-reading means (33) causes some of the test programs previously stored in a primary memory section (32) to be fetched to a secondary memory section (33).
Claim 10
Dependent Claim
62 words
The IC device-testing system according to claim 7, characterized in that said test program-reading means (33) has a test program-loading function, which, when a test program corresponding to the result of the determination of the IC device type-distinguishing data is not previously fetched to said secondary memory section (33), causes the test program to be read from said primary memory section (32).
Claim 11
Dependent Claim
61 words
The IC device-testing system according to claim 7, characterized in that said test program-reading means (33) has a test program-unloading function, which, when a test program corresponding to the result of the determination of the IC device type-distinguishing data is already fetched to said secondary memory section (33), prevents the test program to be read from said primary memory section (32).
References Cited (Backward Citations)
DE2631483A1
Cited
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