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EP0132850A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Self-testing proximity switch

Assignee: Balluff GmbH
•
Filing: 1984-07-26
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Granted: —
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Expires: 2004-07-26
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Abstract

Abstract Translated from German Die Erfindung betrifft einen selbstprüfenden Näherungsschalter, bei dem die Prüfung mit Hilfe von bipolaren Doppelimpulsen erfolgt, die unabhängig vom Schaltzustand der Triggerstufe jedes Mal ein kurzfristiges Kippen derselben herbeiführen. Am Ausgang der Triggerstufe können die überlagerten Impulse durch die Prüfschaltung ausgewertet werden, um eine einwandfreie Funktion des Näherungsschalters zu überwachen. The invention relates to a self-testing proximity switch, in which the test is carried out with the aid of bipolar double pulses, which bring about a short-term tilting of the trigger stage regardless of the switching state. At the output of the trigger stage, the superimposed impulses can be evaluated by the test circuit in order to monitor the correct functioning of the proximity switch.

Inventors

  • 👤 Heinz Kammerer

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-09 20:33
CPC Classifications
H; H03; H03K; H03K17/00; H03K17/94; H03K17/945; H03K17/95; H03K17/9502; H03K17/952; H03K17/9537; H03K17/9542; H03K17/9547

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

DE1124133B Cited
EP0035225A2 Cited
EP0060992A2 Cited
EP0075086A2 Cited
DE3150212C1 Cited
EP0087094A1 Cited
DE3220111C1 Cited

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