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EP0123926A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Process for ion implantation in a semiconductor substrate

Assignee: ITT Inc
•
Filing: 1984-03-30
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Granted: —
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Expires: 2004-03-30
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Abstract

Abstract Translated from German Es wird ein Verfahren zur selektiven Implantation von lonen in ein mittels einer Implantationsmaske (6) aus Photolack maskiertes Substrat (1), insbesondere aus halbisolierendem Galliumarsenid beschrieben, dessen Oberfläche eine metallische Oberflächenschicht (2), insbesondere aus Titan, unter der Implantationsmaske (6) schützt. Nach der Implantation wird die Implantationsmaske (6) und die Oberflächenschicht (2) entfernt und das Substrat (1) getempert. Die Oberflächenschicht (2) wirkt als Pufferschicht und verhindert die Verunreinigung der Substratoberfläche mit Photolackresten während des Tempern, wobei die Photolackreste die elektrischen Eigenschaften der Substratoberfläche beeinträchtigen könnten. The invention relates to a method for the selective implantation of ions in a substrate (1), in particular made of semi-insulating gallium arsenide, which is masked by means of an implantation mask (6) made of photoresist, the surface of which has a metallic surface layer (2), in particular made of titanium, under the implantation mask (6) protects. After the implantation, the implantation mask (6) and the surface layer (2) are removed and the substrate (1) is annealed. The surface layer (2) acts as a buffer layer and prevents contamination of the substrate surface with photoresist residues during the annealing, the photoresist residues could impair the electrical properties of the substrate surface.

Inventors

  • 👤 Mohammed Hani Badawi

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-04 11:38
CPC Classifications
H; H10; H10P; H10P30/00; H10P30/20; H10P30/202; H10P30/206; H10D; H10D30/00; H10D30/80; H10D30/87; H10P30/21; H10P30/212; H10P30/22; Y; Y10; Y10S; Y10S148/00; Y10S148/084; Y10S438/00; Y10S438/942; Y10S438/945

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