EP0118746A2
Expired / Lapsed
EP
⏱️ 0.0 years remaining
Semiconductor laser device
Assignee: Hitachi Ltd
•
Filing: 1984-02-06
•
Granted: —
•
Expires: 2004-02-06
Abstract
Abstract In a semiconductor laser device of the type which includes at least one laminate of a first dielectric layer (2) and a second dielectric layer (3) on at least one of the two facets of a resonator (11) and in which the refractive index of the first dielectric layer is lower than that of the second dielectric layer, the improvement wherein the second dielectric layer consists of an amorphous material containing silicon and hydrogen at its essential constituent elements.
Inventors
- 👤 Yoshimitsu Sasaki
- 👤 Takashi Kajimura
- 👤 Naoki Chinone
- 👤 Michiharu Nakamura
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-05 22:38
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/02; H01S5/028
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
80 words
In a semiconductor laser device of the type which includes at least one laminate of a first dielectric layer (2) and a second dielectric layer (3) on at least one of two facets of a resonator (11) and in which the refractive index of said first dielectric layer (2) is lower than that of said second dielectric layer (3), characterized in that said second dielectric layer (3) consists of an amorphous material containing silicon and hydrogen at its essential elements.
Claim 2
Dependent Claim
80 words
In a semiconductor laser device of the type which includes at least one laminate of a first dielectric layer (2) and a second dielectric layer (3) on at least one of two facets of a resonator (11) and in which the refractive index of said first dielectric layer (2) is lower than that of said second dielectric layer (3), characterized in that said second dielectric layer (3) consists of an amorphous material containing silicon and hydrogen at its essential elements.
Claim 3
Dependent Claim
32 words
The semiconductor-laser device as defined in claim 1 wherein said laminate of said first (2) and second (3) dielectric layers improves the refractive index of said facet on which they are deposited.
Claim 4
Dependent Claim
59 words
The semiconductor laser device as defined in claim 1 wherein the thickness of said first (2) and second (3) dielectric layers are substantially λ/4n 1 and λ/4n 2 , respectively, where X is the oscillation wave length of the laser and n 1 and n 2 are the refractive indices of said first (2) and second (3) dielectric layers.
Claim 5
Dependent Claim
33 words
The semiconductor laser device as defined in claim 1 wherein said amorphous material containing silicon and hydrogen as its essential constituent elements has a composition Si l-x H x (where 0.002 < x<0.4).
Claim 6
Dependent Claim
33 words
The semiconductor laser device as defined in claim 1 wherein said amorphous material containing silicon and hydrogen as its essential constituent elements has a composition Si l-x H x (where 0.03 < x<0.4).
Claim 7
Dependent Claim
37 words
The semiconductor laser device as defined in any of claims 1, 2, 3, 4 and 5 wherein a dielectric layer (1) for reducing the facet refractive index is disposed on the other of said two resonator facets.
Claim 8
Dependent Claim
46 words
The semiconductor laser device as defined in claim 6 wherein the thickness of said dielectric layer (1) for reducing the facet refractive index is substantially X/4n' where λ is the oscillation wave length of the laser and n' is the refractive index of said dielectric layer.
Claim 9
Dependent Claim
31 words
The semiconductor laser device as defined in any of claims 1 through 6 wherein a plurality of said laminates consisting of said first (2) and second (3) dielectric layers are deposited.
Claim 10
Dependent Claim
146 words
In a semiconductor laser device having dielectric films (1,2) on two facets for taking out the emitted optical output of a semiconductor laser, characterized in that a first dielectric film (2) having a low refractive index (n1), a second dielectric film (3) having a high refractive index (n 2 ), a third dielectric film (4) having a low refractive index (n 3 ) and a fourth dielectric film (5) having a high refractive index (n 4 ) are sequentially laminated on one of the two facets in the thickness of λ/4n 1 , λ/4n 2 , λ/4n 3 and λ/4n 4 (X=oscillation wavelength of the laser), respectively, and a fifth dielectric film (1) having a refractive index n 5 is deposited on the other facet in a thickness of λ/4n 5 (where n 5 , n 1 , n 3 <n 2 , n 4 ).
Claim 11
Dependent Claim
146 words
In a semiconductor laser device having dielectric films (1,2) on two facets for taking out the emitted optical output of a semiconductor laser, characterized in that a first dielectric film (2) having a low refractive index (n1), a second dielectric film (3) having a high refractive index (n 2 ), a third dielectric film (4) having a low refractive index (n 3 ) and a fourth dielectric film (5) having a high refractive index (n 4 ) are sequentially laminated on one of the two facets in the thickness of λ/4n 1 , λ/4n 2 , λ/4n 3 and λ/4n 4 (X=oscillation wavelength of the laser), respectively, and a fifth dielectric film (1) having a refractive index n 5 is deposited on the other facet in a thickness of λ/4n 5 (where n 5 , n 1 , n 3 <n 2 , n 4 ).
Claim 12
Dependent Claim
32 words
The semiconductor laser device as defined in claim 9 wherein a sixth dielectric film (6) is further deposited on said fourth dielectric film in a thickness of (n 6 : refractive index).
Claim 13
Dependent Claim
32 words
The semiconductor laser device as defined in claim 10 wherein said sixth dielectric film (6) consists of a SiO 2 film, Aℓ 2 O 3 film or Si 3 N 4 film.
Claim 14
Dependent Claim
53 words
The semiconductor laser device as defined in claim 9 wherein said fifth (1), first (2) and third (4) dielectric films consist of a SiO 2 film, Aℓ 2 O 3 film or Si 3 N 4 film while said second (3) and fourth (5) dielectric films consist of a hydrogen-containing amorphous Si film.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
Maintenance schedule is calculated for granted US utility patents.