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EP0117867A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Mitsubishi Electric Corp
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Filing: 1982-08-26
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Granted: —
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Expires: 2002-08-26
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Abstract

Abstract In an integrated circuit which has a power transistor and a control transistor formed separated by an isolation region on a semiconductor substrate, a buried p-type layer (3) is formed directly on the semiconductor substrate(1), and a buried n-type layer (4) is formed on the layer (3). A high resistance n-type layer (13) is then formed by an epitaxial , growth method over the whole surface, a p-type isolation diffused region (6) connected to the p-type layer (3) and an n-type isolation diffused layer (7) connected to the n-type layer (4) are formed, a control transistor or a resistor is formed in the isolated n-type epitaxial layer, and a power transistor is formed in the epitaxial layer which is not isolated.

Inventors

  • 👤 Shiro C/O Mitsubishi Denki K. K. Iwatani

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-31 17:44
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/60; H10D84/641; H10D84/642; H10W; H10W10/00; H10W10/01; H10W10/031; H10W10/30; H10W15/00; H10W15/01

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 154 words
(1) A semiconductor device having a plurality of circuit elements on the same semiconductor substrate which has formed thereon a first region of a second type conductivity buried in and formed on one interior of the semiconductor substrate making a region of a first type conductivity, a second region of the second type conductivity formed into the form of a wall with respect to the first region of this second type conductivity, and active elements or passive elements formed in the region of the first type conductivity isolated into a plurality by the first and second regions of said second type conductivity, characterized in that the region of the first type conductivity is composed of a low resistance region making the substrate and a high resistance region, and the first region of said second type conductivity is buried to bridge a broundary between the low and high resistance regions of the first type conductivity.
Claim 2
Dependent Claim 90 words
(2) A semiconductor device according to Claim 1 wherein the device has at least a high power semiconductor element and control circuit elements and is composed so that the high power semiconductor element is formed on portions of the high resistance region of the first type conductivity continuously formed with respect to the low resistance region of said first type conductivity, and the control circuit elements are formed on the high resistance region of the first type conductivity isolated by the first and second regions of the second type conductivity.

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