Improvements relating to ion-beam apparatus

Abstract

Abstract @ A system for incorporation in ion-beam equipment to provide ion species filtering and optional ion beam blanking. The system comprises four magnets 4, 5, 6 and 7 arranged on an axis 1. lnbetween magnets 5 and 6 is arranged a plate 10 having an offaxis aperture 11. The ion beam, shown under reference 2, is caused to converge to a focus on plane 3 where the plate 10 is situated. When the magnets 4-7 are energised, the ion beam is caused to bend in the manner shown in drawing A, the amount of deflection depending upon the charge-to-mass ratio of the ion species within the beam. If constructed correctly, the aperture 11 can thus be arranged to pass only a single ion species, the remainder colliding with and being absorbed by the plate 10. Beam blanking may optionally be achieved by blanking plates 13 which may be used to deflect the ion beam out of the plane of parts A and B of the drawing - this is shown in part D of the drawing where it will be seen that the resultant focal point 17 of the ion beam is displaced away from the aperture 11 so that the whole ion beam is blanked off. Astigmatism introduced into the system may be reduced or eliminated by the use of octopole electrode sets 14 and 15.

Inventors

• 👤 John Richard Adrian Dr. Cleaver
• 👤 Haroon Dr. Department Of Engineering Ahmed

Bibliographic Details