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EP0097833A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Substrate for integrated circuit packages

Assignee: International Business Machines Corp
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Filing: 1983-06-01
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Granted: —
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Expires: 2003-06-01
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Abstract

Abstract The top surface metallurgy of LSI chip carriers is improved by multiple and phased interface of metal layers which enable such metallurgies to be suitable for joining by solder reflow and wire bonding techniques. The modifications result in separating the solder bonding metallurgy from the fan-out conductor metallurgy with an intermediate layer of a metal such as Cr or Ti which prevents the formation of intermetallic alloys which are mechanically weak or brittle and tend to fracture because of thermal fatigue stresses caused by thermal cycling during either multiple (up to 50) solder bonding reflow operations or operation of the circuit. The fan-out metallurgy conductors are preferably composed of Cr-Cu-Cr layers covered by at least one upper metal layer which is separated from the Cu of the conductor by means of a metal such as phased layers of Cr or Ti deposited before the other upper metal layer or layers. Solder ball bonding surfaces are composed of additional metal in the form of Au, Cu and Ni. The solderless bonding surfaces are composed of a metal selected from Au, Cr, Ti, Al and Co. The figure shows a substrate 20 having a fan-out metallurgical structure comprising Cr layers 21, 23 and Cu layer 22. Cr/Cu phase layer 24 separates layer 23 from Cu layer 25 which is overlaid by Cr layer 26. A top coating 29 of ploymer protects the underlying layers. The layers 29, 26 are apertured at regions 28 to permit soldered connections to be made to Cu layer 25 whereas only layer 29 is apertured to permit solderless connections to be made to Cr layer 26.

Inventors

  • 👤 Somnath Bhattacharya
  • 👤 Dudley Augustus Chance
  • 👤 Nicholas George Koopman
  • 👤 Sudipta Kumar Ray

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-05 20:14
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/22; H05K3/24; H05K3/244; H10; H10W; H10W70/00; H10W70/60; H10W70/611; H10W70/62; H10W70/66; H05K3/38; H05K3/388; Y; Y10; Y10T; Y10T428/00; Y10T428/12; Y10T428/12493; Y10T428/125; Y10T428/12507; Y10T428/12528; Y10T428/12535; Y10T428/12583; Y10T428/12771; Y10T428/12861; Y10T428/12882

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 119 words
A packaging substrate for integrated circuits including a fan-out metallurgical structure formed near the surface of the substrate, said metallurgy comprising first connection regions to the substrate can be made, second solder connection regions (18: 28: 38: 48) to which connections can also be made by soldering and third solderless connection regions (17: 27: 37: 47) to which connections can be made by thermal bonding solderlessly, the surface of the second solder bonding regions (18: 28: 38: 48) comprising a metal selected from the group consisting of Au, Cu and Ni and the surfaces of the third, solderless bonding regions (17: 27: 37: 47) comprising a metal selected from the group consisting of Au, Cr, Ti, Al and Co.
Claim 2
Dependent Claim 119 words
A packaging substrate for integrated circuits including a fan-out metallurgical structure formed near the surface of the substrate, said metallurgy comprising first connection regions to the substrate can be made, second solder connection regions (18: 28: 38: 48) to which connections can also be made by soldering and third solderless connection regions (17: 27: 37: 47) to which connections can be made by thermal bonding solderlessly, the surface of the second solder bonding regions (18: 28: 38: 48) comprising a metal selected from the group consisting of Au, Cu and Ni and the surfaces of the third, solderless bonding regions (17: 27: 37: 47) comprising a metal selected from the group consisting of Au, Cr, Ti, Al and Co.
Claim 3
Dependent Claim 23 words
A substrate as claimed in claim 1 wherein the base metallurgy (layer 11: 21: 31: 41) of the conductor comprises Cr or Ti.
Claim 4
Dependent Claim 54 words
A substrate in accordance with claim 2 wherein the second layer (12: Fig. 1) comprises Cu and the third layer comprises Cr with the succeeding layers (14, 15, 16) comprising Cr, Cu and Au with the layer of Au on the surface adapted for inclusion in the solder and solderless surface regions (18, 17).
Claim 5
Dependent Claim 60 words
A substrate as claimed in claim 2 wherein the second layer (22: Fig. 2) comprises Cu, the third layer (23) comprises Cr, the fourth layer (24) comprises Cr and Cu in that order and the upper layer (26) comprises Cr or Ti with the upper layer of Cr or Ti removed in the surface areas of the second regions (28).
Claim 6
Dependent Claim 60 words
A substrate as claimed in claim 2 wherein the second layer (32: Fig. 3.1) comprises Cu, the third layer (33) comprises Cr, the fourth layer (34) comprises Cr and Cu in that order and a fifth layer (35) of Cu with the Cu removed in the solderless bonding regions (37) leaving Cu for solder bonding in the solder bonding region.
Claim 7
Dependent Claim 49 words
A substrate as claimed in claim 2 wherein said second layer (32': Fig. 3.2) comprises Al, and the third layer (35') comprises Ni with the solder bonding region being (38) the exposed surfaces of said third layer, and the solderless bonding regions (37) comprising openings to said second layer.
Claim 8
Dependent Claim 82 words
A substrate as claimed in claim 2 wherein the second layer (32: Fig. 3.3) is composed of copper or gold, the third layer (33) is composed of Cr or Co and the fourth layer (35') is composed of Ni or Cu with the solder bonding regions (38) being formed by the surface of said fourth layer (35') and the solderless bonding regions (37) being formed by the surface of said third layer in areas thereof exposed through openings in the fourth layer.
Claim 9
Dependent Claim 72 words
A substrate in accordance with claim 2 wherein the second layer (42: Fig. 4.1) is composed of Cu, the third layer (43) is composed of Cr which is exposed in the solderless bonding regions (47) of the structure, with at least one opening made for the solder bonding regions (48) in a coating layer (49) into which is deposited a metallic layer (44) comprising Cr covered with a layer (45) of Cu.
Claim 10
Dependent Claim 79 words
A substrate in accordance with claim 2 wherein the second layer (42': Fig. 4.2) is composed of Al, alloys of Al or Au and the solderless bonding regions (47) are formed by areas of the second layer exposed through openings down to the second layer formed in a coating layer (49), the layer (49) having other openings with a layer (45') of Ni, Cu, Pd or Pt deposited into said other openings to form the solder bonding regions (48).
Claim 11
Dependent Claim 74 words
A substrate in accordance with claim 2 wherein the second layer (42: Fig. 4.3) is composed of Cu, the third layer (42) is composed of Cr or Co, and the solderless bonding regions (47) are formed on the surface of said third layer, with the solder bonding areas formed by deposition of a layer (45") of Ni or Cu on the third layer in the desired areas, through openings in a dielectric coating area.

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