← Back to Patent Explorer
EP0084265A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Method of producing a semiconductor device comprising a plurality of recrystallized monocrystal regions

Assignee: Fujitsu Ltd
•
Filing: 1982-12-24
•
Granted: —
•
Expires: 2002-12-24
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method for producing a semiconductor device comprising the steps of: forming an insulating layer on a substrate, said insulating layer having a plurality of concave portions respectively including a concave; forming a non-single crystalline silicon layer on a surface of said insulating layer; patterning said non-single crystalline silicon layer so that each concave portion is independently melting and flowing said patterned non-single crystalline silicon layer into said concave to form a single crystalline region in said concave by an irradiation with an energy ray; and forming a semiconductor element in said single crystalline region.

Inventors

  • 👤 Tsutomu Ogawa
  • 👤 Hajime Kamioka
  • 👤 Seiichiro Kawamura
  • 👤 Junji Sakurai

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-29 12:59
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/32; H10P14/3202; H10P14/3238; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3451; H10P14/3452; H10P14/3458; H10P14/38; H10P14/3802; H10P14/3808; H10P14/3818; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/061; H10W10/10; H10W10/181; H10P90/1912

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 102 words
A method for producing a semiconductor device comprising the steps of: forming an insulating layer on a substrate, said insulating having a plurality of concave portions respectively including a concave; forming a non--single crystalline silicon layer on a surface of said insulating layer; patterning said non-single crystalline silicon layer so that each concave portion is independently covered with said patterned non-single crystalline silicon layer; melting and flowing said patterned non-single crystalline silicon layer into said concave to form a single crystalline region in said concave by an irradiation with an energy ray; and forming a semiconductor element in said single crystalline region.
Claim 2
Independent Claim 102 words
A method for producing a semiconductor device comprising the steps of: forming an insulating layer on a substrate, said insulating having a plurality of concave portions respectively including a concave; forming a non--single crystalline silicon layer on a surface of said insulating layer; patterning said non-single crystalline silicon layer so that each concave portion is independently covered with said patterned non-single crystalline silicon layer; melting and flowing said patterned non-single crystalline silicon layer into said concave to form a single crystalline region in said concave by an irradiation with an energy ray; and forming a semiconductor element in said single crystalline region.
Claim 3
Dependent Claim 35 words
A method according to claim 1, wherein before the irradiation with said energy ray, impurities are introduced into said non-single crystalline layer and P type and N type regions are simultaneously formed by the irradiation.
Claim 4
Dependent Claim 51 words
A method according to any one of claim 2, wherein after introducing said impurities, the a mask layer for preventing diffusion of said impurities is formed on said non-single crystalline layer, a cap layer is formed on said mask layer, and said energy ray is irradiated from above said cap layer.
Claim 5
Independent Claim 30 words
A method according to any one of claims 1 to 3, wherein said non-single crystalline layer is a member selected from the group consisting of polycrystalline silicon and amorphous silicon.
Claim 6
Independent Claim 31 words
A method according to any one of claims 1 to 4, wherein said energy ray is a member selected from the group consisting of laser beam, electron beam, and ion beam.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Maintenance schedule is calculated for granted US utility patents.

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag