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EP0068045A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Crystal X-ray sequential spectrometer

Assignee: Siemens AG
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Filing: 1981-10-22
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Granted: —
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Expires: 2001-10-22
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Abstract

Abstract Translated from German Um bei einem Kristall-Röntgen-Sequenzspektrometer mit einem gekrümmten Analysatorkristall (10) und einem erstauflösenden Detektor (38) eine hohe Quantenausbeute, eine weitgehende Unterdrückung von Streustrahlung und eine Erhöhung der Meßgeschwindigkeit zu erzielen, ist der erstauflösende Detektor (38) beweglich angeordnet. In order to achieve a high quantum yield, extensive suppression of stray radiation and an increase in the measurement speed in a crystal X-ray sequence spectrometer with a curved analyzer crystal (10) and a first-resolving detector (38), the first-resolving detector (38) is movably arranged.

Inventors

  • 👤 Herbert Dr.rer.nat. Dipl.-Phys. Göbel
  • 👤 Rupert Köpl

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-09 06:21
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/20; G01N23/207; G01N23/2076; G01N23/22; G01N23/223

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