← Back to Patent Explorer
EP0051396A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Process for preparing thin film transistor arrays

Assignee: Xerox Corp
•
Filing: 1981-10-21
•
Granted: —
•
Expires: 2001-10-21
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A process for the preparation of thin film transistors and thin film transistor arrays as described wherein, in a single pump-down, the semiconductive pad (21), the source electrode (23, 25), the drain electrode (23, 25) and an insulating layer (27, 29) over the source electrode, drain electrode, and the exposed portion of the semiconductive layer is applied in a single vacuum pump-down by the deposition of the various materials through a shadow mask having openings therein of a size equal to the size of the semiconductive pad to be deposited. The mask is first utilized to deposit the semiconductive pad then moved in a direction of 180° with respect to the first direction a distance of approximately twice that of the original motion and the second conductor applied by deposition through the openings in the mask. Finally, the remaining portion of the thin film transistors are completed by conventional technology.

Inventors

  • 👤 Fang Chen Luo

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-30 05:07
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/674; H10D30/6741; H10D30/6743; H10D30/6755; H10D86/00; H10D86/01; H10D86/021; H10D86/0231; H10D86/40; H10D86/60; H10D99/00; H10P; H10P76/00; H10P76/40; Y; Y10; Y10S; Y10S148/00; Y10S148/106; Y10S148/143; Y10S438/00; Y10S438/942; Y10S438/943

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 302 words
A process for manufacturing a thin film transistor array including a plurality of thin film transistors, each transistor having a source electrode (23, 25), a drain electrode (23, 25) and an insultated gate electrode (33) positioned with respect to a semiconductor pad (21), said plurality of thin film transistors arranged in rows and columns, each source electrode of each transistor in any given row being connected to a common bus conductor, each gate of each transistor in any given column being connected to a common bus conductor to form a matrix whereby any given transistor of the array can be addressed, each transistor having at least the interface of the semiconductor pad with the next adjacent subsequently deposited layers formed in a single vacuum pump-down, including the steps of forming the semiconductor pads (21) by depositing a semiconductor material through a mask (11) having openings (13) therein commensurate to the size, shape and relative position of the semiconductive pads to be deposited, moving the mask in a first direction parallel to one of the matrix axes for a specified distance, depositing a conductive material (23) through the openings in the mask to form a first , electrical contact to each semiconductive pad,movingthe mask in a direction 180° with respect to said first direction a distance of about twice the distance of the initial movement, depositing a conductive material (25) through the openings in the mask to form a second electrical contact to each semiconductive pad, depositing an insulating layer (27, 29) over at least the areas occupied by the semiconductor pads, removing the prepared structure from vacuum, applying discrete areas of conductive material (33) over the insulating layer to form the gate electrode of each transistor of the array, and forming the source bus conductors (31) and the gate bus conductors (35).
Claim 2
Dependent Claim 302 words
A process for manufacturing a thin film transistor array including a plurality of thin film transistors, each transistor having a source electrode (23, 25), a drain electrode (23, 25) and an insultated gate electrode (33) positioned with respect to a semiconductor pad (21), said plurality of thin film transistors arranged in rows and columns, each source electrode of each transistor in any given row being connected to a common bus conductor, each gate of each transistor in any given column being connected to a common bus conductor to form a matrix whereby any given transistor of the array can be addressed, each transistor having at least the interface of the semiconductor pad with the next adjacent subsequently deposited layers formed in a single vacuum pump-down, including the steps of forming the semiconductor pads (21) by depositing a semiconductor material through a mask (11) having openings (13) therein commensurate to the size, shape and relative position of the semiconductive pads to be deposited, moving the mask in a first direction parallel to one of the matrix axes for a specified distance, depositing a conductive material (23) through the openings in the mask to form a first , electrical contact to each semiconductive pad,movingthe mask in a direction 180° with respect to said first direction a distance of about twice the distance of the initial movement, depositing a conductive material (25) through the openings in the mask to form a second electrical contact to each semiconductive pad, depositing an insulating layer (27, 29) over at least the areas occupied by the semiconductor pads, removing the prepared structure from vacuum, applying discrete areas of conductive material (33) over the insulating layer to form the gate electrode of each transistor of the array, and forming the source bus conductors (31) and the gate bus conductors (35).
Claim 3
Dependent Claim 15 words
The process of claim 1, wherein the semiconducting pads are applied to a substrate (15).
Claim 4
Dependent Claim 27 words
The process of claim 1, wherein the semiconductor pads are deposited onto an insulating layer (17) previously applied to a substrate (15) in the same vacuum pump-down.
Claim 5
Dependent Claim 29 words
The process of claim 1, wherein the semiconductor pads are deposited onto an insulating layer (17) applied over a uniform layer (19) of a conductor disposed on a substrate(15).
Claim 6
Dependent Claim 19 words
The process of claim 4, wherein the conductive layer is applied to the substrate in the same vacuum pump-down.
Claim 7
Dependent Claim 149 words
A process for manufacturing a thin film transistor, which comprises: positioning a substrate (15) in a vacuum chamber, pumping down the vacuum chamber, depositing a layer (17) of an insulating material on the substrate, forming a semiconductor pad (21) by depositing a semiconductor material through a mask having an opening therein, moving the mask in a first direction, depositing a conductive material (23) through the opening in the mask to form a first electrical contact to the semiconductive pad, moving the mask in a direction 180° with respect to said first direction a distance of about twice the distance of the initial movement, depositing a conductive material (25) through the opening in the mask to form a second electrical contact to the semiconductive pad, depositing an insulating layer (27, 29) over the conductive contacts and the semiconductor pad and applying a conductive gate electrode (33) over the insulating layer.
Claim 8
Dependent Claim 149 words
A process for manufacturing a thin film transistor, which comprises: positioning a substrate (15) in a vacuum chamber, pumping down the vacuum chamber, depositing a layer (17) of an insulating material on the substrate, forming a semiconductor pad (21) by depositing a semiconductor material through a mask having an opening therein, moving the mask in a first direction, depositing a conductive material (23) through the opening in the mask to form a first electrical contact to the semiconductive pad, moving the mask in a direction 180° with respect to said first direction a distance of about twice the distance of the initial movement, depositing a conductive material (25) through the opening in the mask to form a second electrical contact to the semiconductive pad, depositing an insulating layer (27, 29) over the conductive contacts and the semiconductor pad and applying a conductive gate electrode (33) over the insulating layer.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Maintenance schedule is calculated for granted US utility patents.

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag