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EP0008043A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Integrated bipolar semiconductor circuit

Assignee: Siemens AG
•
Filing: 1979-07-26
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Granted: —
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Expires: 1999-07-26
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Abstract

Abstract 1. An integrated bipolar semiconductor switching circuit comprising transistors having a high breakdown voltage of preferably 30 V, together with transistors of a high current gain, in particular l**2-L-transistors, in which, in an epitaxial layer (3) arranged on a semiconductor substrate, base zone (8) of the high current gain transistors and base zones (4) of the transistors having a high breakdown voltage are formed in such a way that the base zones (4) of the high current gain transistors are less highly doped than the base zones (8) of the transistors having a high breakdown voltage, and have a greater depth measured from the exposed surface of the epitaxial layer (3), characterized in that the epitaxial layer (3), has a constant thickness.

Inventors

  • 👤 Günter Von Dr. Dipl.-Phys Häfen

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-30 02:36
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/01; H10D84/0112; H10D62/00; H10D62/10; H10D62/17; H10D62/177; H10D84/02; H10D84/03; H10D84/038; H10D84/60; H10D84/65; H10D84/658

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

DE2538326A1 Cited
DE2455347A1 Cited
DE2532608A1 Cited
FR2319197A1 Cited
DE2655400A1 Cited
DE2557911A1 Cited
FR2336798A1 Cited
DE2800240A1 Cited

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