CH338170A
Expired / Lapsed
CH
⏱️ 0.0 years remaining
Apparatus for determining the percentage of moisture contained in a semiconductor material and for controlling a machine in which this material is processed
Assignee: Eicken Henri
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Filing: 1956-10-26
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Granted: —
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Expires: 1976-10-26
Abstract
No abstract record available.
Inventors
- 👤 Eicken Henri
Bibliographic Details
Application Number
—
Jurisdiction
CH
Data Source
google_patents
Last Synchronized
2026-11-05 11:28
CPC Classifications
G; G05; G05D; G05D22/00; G05D22/02; D; D06; D06B; D06B1/00; G01; G01N; G01N27/00; G01N27/02; G01N27/04; G01N27/048; D06C; D06C2700/00; D06C2700/13; D06C2700/135
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References Cited (Backward Citations)
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