CA970830A
Expired / Lapsed
CA
⏱️ 0.0 years remaining
Method and apparatus for measuring the parameters of a transistor or other two-port device at microwave frequencies
Assignee: International Business Machines Corp
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Filing: 1972-12-27
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Granted: 1975-07-08
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Expires: 1992-12-27
Abstract
No abstract record available.
Inventors
- 👤 Shashi D. Malaviya
Bibliographic Details
Application Number
—
Jurisdiction
CA
Data Source
google_patents
Last Synchronized
2026-11-03 07:55
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2608
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References Cited (Backward Citations)
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