Patent Explorer
Browse, filter, and analyze 2 patents across global jurisdictions.
| Patent Number | Title | Assignee | Status | Filing Date | Grant Date | Expires | Remaining | Claims | Actions |
|---|---|---|---|---|---|---|---|---|---|
| US5524114A | Method and apparatus for testing semiconductor devices at speed | LSI Corp | Expired / Lapsed | 1993-10-22 | 1996-06-04 | 2013-10-22 | 0.0 yrs | 14 | |
| US5123375A | Structure for filtering CVD chamber process gases | LSI Corp | Expired / Lapsed | 1990-10-02 | 1992-06-23 | 2010-10-02 | 0.0 yrs | 5 |